ANTIBODY-COATED NANOPARTICLE VACCINES
    1.
    发明申请
    ANTIBODY-COATED NANOPARTICLE VACCINES 审中-公开
    抗体涂覆的纳米颗粒疫苗

    公开(公告)号:WO2018049304A1

    公开(公告)日:2018-03-15

    申请号:PCT/US2017/050906

    申请日:2017-09-11

    Abstract: Provided are nanoparticle-based vaccines that have an adjuvant coating attached to the external surface thereof to serve as an immunopotentiator. Most advantageously the nanoparticle vaccines have IgM antibodies attached to the external surface of an antigenic nanoparticle to serve as an immunopotentiator. The IgM may be attached by specifically binding to an epitope of the underlying nanoparticle including, but not limited to, the target vaccine immunogen. Since, however, the availability of specific IgMs is limited and less than the number of potential antigens that may be used as vaccines, attaching an IgM of the disclosure may require a hapten molecule that can be attached to the nanoparticle. By selecting a hapten that can be specifically recognized and bound by an IgM, it is possible to attach the hapten-specific IgM to a wide-variety of vaccine antigens.

    Abstract translation: 提供的是基于纳米粒子的疫苗,其具有附着于其外表面以作为免疫增强剂的佐剂涂层。 最有利的是纳米颗粒疫苗具有附着于抗原性纳米颗粒外表面的IgM抗体以充当免疫增强剂。 IgM可以通过特异性结合下伏纳米颗粒的表位而被连接,所述表位包括但不限于靶标疫苗免疫原。 然而,由于特定IgM的可用性是有限的并且少于可用作疫苗的潜在抗原的数量,因此连接本公开的IgM可能需要可以连接至纳米颗粒的半抗原分子。 通过选择可被IgM特异性识别和结合的半抗原,有可能将半抗原特异性IgM附着到各种各样的疫苗抗原上。

    METHOD AND APPARATUS FOR TEST AND CHARACTERIZATION OF SEMICONDUCTOR COMPONENTS
    2.
    发明申请
    METHOD AND APPARATUS FOR TEST AND CHARACTERIZATION OF SEMICONDUCTOR COMPONENTS 审中-公开
    半导体元件测试和表征的方法和装置

    公开(公告)号:WO2004077524A2

    公开(公告)日:2004-09-10

    申请号:PCT/US2004/005620

    申请日:2004-02-25

    IPC: H01L

    CPC classification number: G11C29/56004 G01R31/31707 G06F11/24 G11C2029/5602

    Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

    Abstract translation: 提供了用于测试和表征电路的方法和装置。 在一个实施例中,半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中,高速测试电路包括测试图形生成电路和各种差分比较器,用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中,包括测试电路的接口可以测试自身或另一接口。 在一个实施例中,定时参考信号使彼此测试的两个接口的各个参数解耦,以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级,元件级和系统中执行。

    SYSTEM AND METHOD FOR PRESSURE WAVE TRANSMISSION AND MEASUREMENT
    4.
    发明申请
    SYSTEM AND METHOD FOR PRESSURE WAVE TRANSMISSION AND MEASUREMENT 审中-公开
    用于压力波传输和测量的系统和方法

    公开(公告)号:WO2008021757A2

    公开(公告)日:2008-02-21

    申请号:PCT/US2007075175

    申请日:2007-08-03

    CPC classification number: G01S7/524 G01S7/52004 G01S7/539

    Abstract: A system and method for measurement are disclosed which may include providing an input command signal; convolving the input command signal with a plurality of impulse signals to produce a transducer drive signal; and activating a first pressure transducer with the drive signal to transmit a pressure wave output from the transducer.

    Abstract translation: 公开了一种用于测量的系统和方法,其可以包括提供输入命令信号; 用多个脉冲信号卷积输入命令信号以产生换能器驱动信号; 以及用所述驱动信号激活第一压力换能器以传送从所述换能器输出的压力波。

    METHOD AND APPARATUS FOR TEST AND CHARACTERIZATION OF SEMICONDUCTOR COMPONENTS
    5.
    发明申请
    METHOD AND APPARATUS FOR TEST AND CHARACTERIZATION OF SEMICONDUCTOR COMPONENTS 审中-公开
    半导体元件测试和表征的方法和装置

    公开(公告)号:WO2004077524A3

    公开(公告)日:2005-10-27

    申请号:PCT/US2004005620

    申请日:2004-02-25

    CPC classification number: G11C29/56004 G01R31/31707 G06F11/24 G11C2029/5602

    Abstract: A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.

    Abstract translation: 提供了用于测试和表征电路的方法和装置。 在一个实施例中,半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中,高速测试电路包括测试图形生成电路和各种差分比较器,用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中,包括测试电路的接口可以测试自身或另一接口。 在一个实施例中,定时参考信号使彼此测试的两个接口的各个参数解耦,以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级,元件级和系统中执行。

    POST-OVERLAY COMPENSATION ON LARGE-FIELD PACKAGING

    公开(公告)号:WO2022187276A1

    公开(公告)日:2022-09-09

    申请号:PCT/US2022/018385

    申请日:2022-03-01

    Abstract: A lithography challenge for large heterogeneous integration of integrated circuit devices is the limited size of the exposure field (typically 60 mm x 60 mm or smaller) for most currently available lithography systems, Smaller-field systems can be used to pattern large substrates (e.g., panels) by stitching together multiple exposure fields. However, the stitching of exposure fields affects both productivity and yield because of the need for multiple exposures, which includes multiple reticles, and a risk of alignment errors at the stitching boundaries, A large-exposure field eliminates these problems associated with smaller exposure fields. However, there are also challenges associated with a large-exposure field, such as exposing onto a possibly warped or distorted panel. Various examples disclosed herein include a post-overlay compensation method that use an overlay-model prior to exposing the panel to reduce or eliminate errors due to the warped, or distorted panel. Other methods and systems are also disclosed.

    SYSTEMS AND METHODS FOR SUSTAINABLE WASTEWATER AND BIOSOLIDS TREATMENT
    7.
    发明申请
    SYSTEMS AND METHODS FOR SUSTAINABLE WASTEWATER AND BIOSOLIDS TREATMENT 审中-公开
    可持续废水和生物活性剂处理的系统和方法

    公开(公告)号:WO2009046417A1

    公开(公告)日:2009-04-09

    申请号:PCT/US2008/078934

    申请日:2008-10-06

    Abstract: Methods of sustainable wastewater and biosolids treatment using a bioreactor including a microbial fuel cell are disclosed. In some embodiments, the methods include the following: enriching an anode of the microbial fuel cell in the bioreactor with a substantially soluble electron acceptor; growing the bacteria in the presence of the anode enriched with a substantially soluble electron acceptor; oxidizing a substrate using the bacteria to produce free electrons; channeling the free electrons away from a terminal electron acceptor and to the enriched anode, the enriched anode serving as an electron acceptor; and carrying the free electrons from the enriched anode to a cathode of the microbial fuel cell to generate electricity.

    Abstract translation: 公开了使用包括微生物燃料电池的生物反应器的可持续废水和生物固体处理方法。 在一些实施方案中,所述方法包括以下:用基本上可溶的电子受体富集生物反应器中微生物燃料电池的阳极; 在富含基本上可溶的电子受体的阳极存在下生长细菌; 使用细菌氧化底物以产生自由电子; 将自由电子引导离开终端电子受体和富集的阳极,富集的阳极用作电子受体; 并将自由电子从富集阳极运送到微生物燃料电池的阴极以发电。

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