EVANESCENT MICROWAVE MICROSCOPY PROBE AND METHODOLOGY
    1.
    发明申请
    EVANESCENT MICROWAVE MICROSCOPY PROBE AND METHODOLOGY 审中-公开
    历史微波微观探测与方法论

    公开(公告)号:WO2009158598A3

    公开(公告)日:2010-03-25

    申请号:PCT/US2009048824

    申请日:2009-06-26

    CPC classification number: G01Q60/22 B82Y20/00 B82Y35/00

    Abstract: The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.

    Abstract translation: 本公开一般涉及消逝的微波显微镜探针及其制造和使用方法。 一些实施例涉及由银构成的探针。 其他实施例涉及一种测量目标材料的未知性质的方法,包括将探针远离目标材料移动,进行第一测量,移动探针使得其接触目标材料,进行第二测量,并且比较第一 和第二次测量以便测量未知属性。

    EVANESCENT MICROWAVE MICROSCOPY PROBE AND METHODOLOGY
    2.
    发明申请
    EVANESCENT MICROWAVE MICROSCOPY PROBE AND METHODOLOGY 审中-公开
    历史微波微观探测与方法论

    公开(公告)号:WO2009158598A2

    公开(公告)日:2009-12-30

    申请号:PCT/US2009/048824

    申请日:2009-06-26

    CPC classification number: G01Q60/22

    Abstract: The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.

    Abstract translation: 本公开一般涉及消逝的微波显微镜探针及其制造和使用方法。 一些实施例涉及由银构成的探针。 其他实施例涉及一种测量目标材料的未知性质的方法,包括将探针远离目标材料移动,进行第一测量,移动探针使得其接触目标材料,进行第二测量,并且比较第一 和第二次测量以便测量未知属性。

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