公开(公告)号：WO2009158598A2

公开(公告)日：2009-12-30

申请号：PCT/US2009/048824

申请日：2009-06-26

Applicant: WRIGHT STATE UNIVERSITY ,  KLEISMIT, Richard, A. ,  HULL, Barbara, E. ,  KOZLOWSKI, Gregory ,  FOY, Brent

Inventor： KLEISMIT, Richard, A. ,  HULL, Barbara, E. ,  KOZLOWSKI, Gregory ,  FOY, Brent

IPC: G12B21/02 ,  G01N13/10 ,  G01R1/06

CPC classification number: G01Q60/22

Abstract: The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.

Abstract translation: 本公开一般涉及消逝的微波显微镜探针及其制造和使用方法。 一些实施例涉及由银构成的探针。 其他实施例涉及一种测量目标材料的未知性质的方法，包括将探针远离目标材料移动，进行第一测量，移动探针使得其接触目标材料，进行第二测量，并且比较第一 和第二次测量以便测量未知属性。

公开(公告)号：WO2009158598A3

公开(公告)日：2010-03-25

申请号：PCT/US2009048824

申请日：2009-06-26

Applicant: UNIV WRIGHT STATE ,  KLEISMIT RICHARD A ,  HULL BARBARA E ,  KOZLOWSKI GREGORY ,  FOY BRENT

Inventor： KLEISMIT RICHARD A ,  HULL BARBARA E ,  KOZLOWSKI GREGORY ,  FOY BRENT

IPC: G01Q10/04 ,  G01Q60/22

CPC classification number: G01Q60/22 ,  B82Y20/00 ,  B82Y35/00

Abstract: The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.

Abstract translation: 本公开一般涉及消逝的微波显微镜探针及其制造和使用方法。 一些实施例涉及由银构成的探针。 其他实施例涉及一种测量目标材料的未知性质的方法，包括将探针远离目标材料移动，进行第一测量，移动探针使得其接触目标材料，进行第二测量，并且比较第一 和第二次测量以便测量未知属性。