HANDSET, SMART CARD AND METHOD FOR CONTROLLING PERIPHERAL DEVICES OF HANDSET WITH SMART CARD
    1.
    发明申请
    HANDSET, SMART CARD AND METHOD FOR CONTROLLING PERIPHERAL DEVICES OF HANDSET WITH SMART CARD 审中-公开
    手提电脑,智能卡和用智能卡控制手机外围设备的方法

    公开(公告)号:WO2010060344A1

    公开(公告)日:2010-06-03

    申请号:PCT/CN2009/074809

    申请日:2009-11-05

    CPC classification number: H04W88/02 G06F9/545 G06F9/547

    Abstract: A handset, a smart card and a method for controlling peripheral devices of the handset with the smart card are provided. The smart card is pluggable in the handset. The smart card includes application programs for peripheral devices tored therein and a second communication module for communicating with the handset. The handset includes: the peripheral devices; a card interface, and a first communication module adapted to communicate with the smart card, and provide a uniform bottom layer drive interface for the peripheral devices, so that the second communication module maps the bottom layer drive interface provided by the first communication module to the smart card and provides the mapped bottom layer drive interface to the application programs in the smart card for use. When the application programs in the smart card call drive interfaces for the peripheral devices provided by the second communication module, the first communication module receives interface calls sent by the second communication module, and maps the received interface call to a drive interface of an actual peripheral device, so that the actual peripheral device performs an interface call operation.

    Abstract translation: 提供了一种手机,智能卡和用于利用智能卡来控制手持设备的外围设备的方法。 智能卡可插入手机。 智能卡包括用于其内部的外围设备的应用程序和用于与手机进行通信的第二通信模块。 手机包括:外围设备; 卡接口和适于与智能卡通信的第一通信模块,并为外围设备提供统一的底层驱动接口,使得第二通信模块将由第一通信模块提供的底层驱动接口映射到 智能卡,并提供映射的底层驱动器接口到智能卡中的应用程序以供使用。 当由第二通信模块提供的用于外围设备的智能卡呼叫驱动器接口中的应用程序程序时,第一通信模块接收由第二通信模块发送的接口呼叫,并将接收的接口呼叫映射到实际外设的驱动接口 设备,使得实际的外围设备执行接口呼叫操作。

    AN APPARATUS AND METHOD FOR STARTING SMARTCARD
    2.
    发明申请
    AN APPARATUS AND METHOD FOR STARTING SMARTCARD 审中-公开
    启动智能卡的设备和方法

    公开(公告)号:WO2010060343A1

    公开(公告)日:2010-06-03

    申请号:PCT/CN2009/074807

    申请日:2009-11-05

    CPC classification number: G06F21/81 G06F21/575 G06F21/77 G06F2221/2153

    Abstract: The present invention relates to an apparatus and method for starting smartcard, wherein a smartcard comprises: an application processor part configured for running applications; a legacy SIM module configured for communicating with a terminal device to which the smartcard is coupled; and a controller configured for supplying a power received from the terminal device to the application processor part when receiving from the legacy SIM module a power-on message, wherein the power-on message being sent to the controller by the legacy SIM module in response to a command from the terminal device for supplying power to the application processor part. With the apparatus and method, a smartcard with both the legacy SIM and the application processor part can work normally when the smartcard is coupled to a terminal device only supporting the smartcard with only the legacy SIM or to a terminal device supporting the smartcard with both the legacy SIM and the application processor part.

    Abstract translation: 本发明涉及一种启动智能卡的装置和方法,其中智能卡包括:应用处理器部分,被配置为运行应用; 配置成与智能卡耦合到的终端设备进行通信的传统SIM模块; 以及控制器,被配置为当从所述传统SIM模块接收到电源接通消息时将从所述终端设备接收的电力提供给所述应用处理器部分,其中所述通电消息由所述传统SIM模块响应于 来自终端装置的用于向应用处理器部分供电的命令。 利用该设备和方法,当智能卡耦合到只支持智能卡仅支持传统SIM卡的终端设备或支持智能卡的终端设备时,具有传统SIM卡和应用处理器部件的智能卡可以正常工作, 传统SIM卡和应用处理器部分。

    APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE
    4.
    发明申请
    APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE 审中-公开
    三维形状测量装置

    公开(公告)号:WO2008147098A1

    公开(公告)日:2008-12-04

    申请号:PCT/KR2008/002968

    申请日:2008-05-28

    CPC classification number: G01B11/2441 G01B9/02028 G01B9/0209 G01B2290/35

    Abstract: An apparatus for measurement of a three-dimensional shape includes a light source, a beam splitter splitting a light emitted from the light source, a measured object projected with the light from the light source, having a height difference between a highest point and a lowest point thereof, a reference plane projected with the light emitted from the beam splitter, a photographing device photographing an interference fringe formed by the lights reflected from a surface of the measured object and from the reference plane and composed, and a controlling computer processing the image photographed by the photographing device. The reference plane further includes a reflection path adjusting unit which supplies reflection paths respectively equal to a reflection path from the highest point and a reflection path from the lowest point of the measured object.

    Abstract translation: 用于测量三维形状的装置包括光源,分束从光源发射的光的分束器,用来自光源的光投影的被测物体,具有最高点和最低点之间的高度差 其中,从分束器发射的光投射的参考平面,拍摄由从测量对象的表面反射并从参考平面反射并组成的光的干涉条纹的拍摄装置,以及控制计算机处理图像 由拍摄装置拍摄。 参考平面还包括反射路径调整单元,其提供反射路径,该反射路径分别等于来自最高点的反射路径和从测量对象的最低点的反射路径。

    SEMICONDUCTOR DEVICE VISION INSPECTING SYSTEM
    5.
    发明申请
    SEMICONDUCTOR DEVICE VISION INSPECTING SYSTEM 审中-公开
    半导体器件视觉检测系统

    公开(公告)号:WO2008143475A1

    公开(公告)日:2008-11-27

    申请号:PCT/KR2008/002873

    申请日:2008-05-22

    CPC classification number: G01N21/95684

    Abstract: A semiconductor device vision inspecting system includes a loading unit and an unloading unit, a loading rail disposed at the rear of the loading unit for allowing a tray to be transferred there along, an unloading rail disposed at the rear of the unloading unit for allowing an unloading tray to be transferred there along, a recycling unit for transferring an empty tray on the loading rail to the unloading rail, a vision inspection unit, a reject rail disposed between the unloading rail and the vision inspection unit for allowing a reject tray to be transferred there along, and a picker module for picking up semiconductor devices from the tray on the loading rail and transferring to the vision inspection unit and for picking up the semiconductor devices and sorting and transferring the semiconductor devices to an unloading tray or a reject tray according to the results of the vision inspection.

    Abstract translation: 半导体器件视觉检查系统包括装载单元和卸载单元,装载轨道,设置在装载单元的后部,用于允许托盘在其上传输;卸载轨道,设置在卸载单元的后部,用于允许 卸载托盘,以将其转移到所述卸载轨道上,用于将装载轨道上的空托盘传送到卸载轨道的再循环单元,视觉检查单元,设置在卸载轨道和视觉检查单元之间的废弃轨道, 转移到那里,以及拾取器模块,用于从装载轨道上的托盘拾取半导体器件,并转移到视觉检查单元并拾取半导体器件,并将半导体器件分类并转移到卸载托盘或拒收托盘 对视力检查的结果。

    APPARATUS FOR INSPECTION OF THREE-DIMENSIONAL SHAPE AND METHOD FOR INSPECTION USING THE SAME
    6.
    发明申请
    APPARATUS FOR INSPECTION OF THREE-DIMENSIONAL SHAPE AND METHOD FOR INSPECTION USING THE SAME 审中-公开
    用于检查三维形状的装置和使用其进行检查的方法

    公开(公告)号:WO2008120882A1

    公开(公告)日:2008-10-09

    申请号:PCT/KR2008/001635

    申请日:2008-03-24

    CPC classification number: G01B11/25

    Abstract: An apparatus for inspection of a three-dimensional shape, capable of selectively adjusting reflectivity or visibility of the surface of an inspection object, and a method for inspection using the same are disclosed. The apparatus includes a light source, a grid pattern generating unit which generates a grid pattern on a surface of an inspection object by transforming light generated from the light source, and an imaging unit which captures an image reflected from the surface of the inspection object, wherein the three-dimensional shape of the inspection object is measured from the image captured by the imaging unit to determine whether there is a defect of the inspection object based on measurement results, and wherein the grid pattern generating unit includes a pixel-based display control unit which controls brightness of each pixel according to surface reflectivity of the inspection object to generate a certain grid pattern.

    Abstract translation: 公开了一种用于检查能够选择性地调节检查对象的表面的反射率或可视性的三维形状的装置以及使用其的检查方法。 该装置包括光源,网格图案生成单元,其通过转换从光源产生的光来在检查对象的表面上产生网格图案;以及摄像单元,其拍摄从检查对象的表面反射的图像, 其特征在于,所述检查对象的三维形状是根据由所述摄像部拍摄到的图像来测量的,以基于测量结果确定是否存在所述检查对象的缺陷,并且所述网格图案生成单元包括基于像素的显示控制 单元,其根据检查对象的表面反射率来控制每个像素的亮度,以产生特定的网格图案。

    SYSTEM FOR VISION INSPECTION OF SEMICONDUCTOR DEVICE
    7.
    发明申请
    SYSTEM FOR VISION INSPECTION OF SEMICONDUCTOR DEVICE 审中-公开
    半导体器件视觉检测系统

    公开(公告)号:WO2008120881A1

    公开(公告)日:2008-10-09

    申请号:PCT/KR2008/001603

    申请日:2008-03-21

    CPC classification number: G01N21/95684 G01R31/2893 G01R31/311 G06T7/0004

    Abstract: The present invention to provide a system for vision insfection of semiconductor device that is capable of receiving a tray to be visually inspected and an unloading tray to receive semiconductor device sorted as good products as a result of the vision inspection to the same loader, and distributing the good semiconductor device to a tray stacked in the same loader or a tray stacked in the opposite loader according to the results of the vision inspection, thereby eliminating a necessity to individually provide loaders and unloaders, and therefore, reducing the size of equipment.

    Abstract translation: 本发明提供一种能够接收待视觉检查的托盘的半导体器件的视觉缺陷系统和用于接收作为对同一装载器的视觉检查的结果而被分类为良好产品的半导体器件的卸载托盘,并且分布 根据视觉检查的结果,将良好的半导体器件设置到堆叠在同一装载器中的托盘或堆叠在相反的装载器中的托盘中,从而消除了单独提供装载机和卸载机的必要性,并因此减小设备的尺寸。

    METHOD FOR IDENTIFYING TAGS USING ADAFITVE BINARY TREE SPLITTING TECHNIQUE IN RFID SYSTEM AND RFID SYSTEM THEREFOR
    8.
    发明申请
    METHOD FOR IDENTIFYING TAGS USING ADAFITVE BINARY TREE SPLITTING TECHNIQUE IN RFID SYSTEM AND RFID SYSTEM THEREFOR 审中-公开
    使用RFID系统中的ADAFITVE BINARY TREE分割技术识别标签的方法及其RFID系统

    公开(公告)号:WO2007037595A1

    公开(公告)日:2007-04-05

    申请号:PCT/KR2006/003581

    申请日:2006-09-08

    CPC classification number: G06K7/0008 G06K7/10049

    Abstract: The RFID system includes an RFID reader for sending information selected from among collision type information, idle type information, and readable type information, to all of the RFID tags depending on the number of signals in the corresponding time slot, and RFID tags for performing functions, in which, when information, indicating that a current time slot is a collision type, is fed back from the RFID reader, each of RFID tags selects one arbitrary value of either 0 or 1 and is assigned a time slot, in which a corresponding RFID tag will send a signal to the RFID reader, based on the selected value, a single tag group that caused a collision is divided into two sub-groups depending on the assigned time slots, and tags of the sub-groups send signals, including IDs thereof, to the RFID reader in different time slots for the respective sub-groups.

    Abstract translation: RFID系统包括RFID读取器,用于根据相应时隙中的信号数量将从冲突类型信息,空闲类型信息和可读类型信息中选出的信息发送到所有RFID标签,以及用于执行功能的RFID标签 其中,当从RFID读取器反馈指示当前时隙是冲突类型的信息时,每个RFID标签选择0或1中的任意值,并且分配一个时隙,其中相应的 RFID标签将根据所选值向RFID读取器发送信号,根据所分配的时隙将导致冲突的单个标签组划分为两个子组,并且子组的标签发送信号,包括 其ID对于相应子组的不同时隙中的RFID读取器。

    EXPANDED PERLITE THERMAL INSULATION MATERIAL USING A THERMOSETTING RESIN, A PRODUCTION METHOD FOR THE SAME AND A PRODUCT USING THE SAME
    9.
    发明申请
    EXPANDED PERLITE THERMAL INSULATION MATERIAL USING A THERMOSETTING RESIN, A PRODUCTION METHOD FOR THE SAME AND A PRODUCT USING THE SAME 审中-公开
    使用热固性树脂的膨胀型热绝缘材料及其制造方法及使用其的产品

    公开(公告)号:WO2012047012A3

    公开(公告)日:2012-06-07

    申请号:PCT/KR2011007364

    申请日:2011-10-05

    CPC classification number: C08J9/0085 C08J9/0066 C08J9/32 C08J2300/24

    Abstract: The present invention relates to an expanded perlite thermal insulation material using a thermosetting resin, wherein the thermal insulation material is formed by using a thermosetting resin to adhere expanded perlite and then a heat treatment is carried out, thereby reducing the thickness of the thermal insulation material because of outstanding thermal conductivity not to mention improved workability due to low density, such that it is possible to economise on material and energy costs and to reduce the equipment installation area. The present invention also relates to a production method for the thermal insulation material and to a product using the thermal insulation material.

    Abstract translation: 本发明涉及使用热固性树脂的膨胀珍珠岩保温材料,其中通过使用热固性树脂粘附膨胀珍珠岩形成绝热材料,然后进行热处理,从而减小绝热材料的厚度 由于优异的导热性,不用说由于低密度而提高了可加工性,使得可以节省材料和能源成本并减少设备安装面积。 本发明还涉及一种隔热材料的制造方法以及使用该保温材料的制品。

    SURFACE SHAPE MEASURING SYSTEM AND SURFACE SHAPE MEASURING METHOD USING THE SAME

    公开(公告)号:WO2009078617A4

    公开(公告)日:2009-06-25

    申请号:PCT/KR2008/007314

    申请日:2008-12-10

    Abstract: The surface shape measuring system includes an illumination unit including a main light source, a focusing lens, and a projection lens; a beam splitter to split illumination light emitted respectively irradiated onto a reference surface and a measurement surface; a light detecting element to capture an interference pattern; and a control computer to obtain surface shape data through white-light interference pattern analysis from an image captured and detect whether or not the measurement surface is defective from the obtained data, wherein a subsidiary light source to provide falling illumination to the target object; and two-dimensional data and three-dimensional data regarding the surface shape of the target object are obtained by selectively intermitting the turning-on of the main light source and the subsidiary light source and the irradiation of the illumination light onto the reference surface.

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