公开(公告)号：WO2003058260A1

公开(公告)日：2003-07-17

申请号：PCT/DK2003/000006

申请日：2003-01-07

Applicant: CAPRES A/S ,  PETERSEN, Christian, Leth ,  NIELSEN, Peter Folmer

Inventor： PETERSEN, Christian, Leth ,  NIELSEN, Peter Folmer

IPC: G01R1/073

CPC classification number: G01Q70/06 ,  G01N27/041 ,  G01Q10/065 ,  G01Q60/30 ,  G01R1/06794

Abstract: An electrical feedback detection system for detecting electrical contact between a multi-point probe and an electrically conducting material test sample surface. The electrical feedback detection system comprises an electrical detector unit connected to a multitude of electrodes in the multi-point probe, and optionally directly to the test sample surface. The detector unit provides an electrical signal to a multi-point testing apparatus, which can be used to determine if the multi-point probe is in electrical contact with the test sample surface. The detector unit comprises an electrical generator means for generating an electrical signal that is driven through a first multitude of electrodes of the multi-point probe, and a second multitude of switched impedance detection elements. The electrical potential across the impedance detection elements determines the electrical contact to the test sample surface.

Abstract translation: 一种用于检测多点探针与导电材料测试样品表面之间的电接触的电反馈检测系统。 电反馈检测系统包括连接到多点探针中的多个电极的电检测器单元，并且可选地直接连接到测试样品表面。 检测器单元向多点测试装置提供电信号，其可用于确定多点探针是否与测试样品表面电接触。 检测器单元包括用于产生通过多点探针的第一多个电极驱动的电信号的发电机装置和第二多个开关阻抗检测元件。 阻抗检测元件两端的电位决定了与测试样品表面的电接触。

公开(公告)号：WO2012155245A1

公开(公告)日：2012-11-22

申请号：PCT/CA2012/000459

申请日：2012-05-14

Applicant: LIONSGATE TECHNOLOGIES, INC. ,  PETERSEN, Christian Leth ,  ANSERMINO, John Mark ,  DUMONT, Guy

Inventor： PETERSEN, Christian Leth ,  ANSERMINO, John Mark ,  DUMONT, Guy

IPC: A61B5/145 ,  A61B5/1455

CPC classification number: A61B5/6898 ,  A61B5/0004 ,  A61B5/0015 ,  A61B5/0205 ,  A61B5/02416 ,  A61B5/02433 ,  A61B5/14552 ,  A61B5/6826 ,  A61B5/7228 ,  A61B5/7278 ,  A61B5/746 ,  A61B2560/045 ,  A61B2562/227

Abstract: Methods, systems and related apparatus are provided to enable an electronic device to operate an external sensor comprising one or more emitters for emitting electromagnetic radiation of two different wavelengths and a detector for generating a response signal based on received electromagnetic radiation of the two different wavelengths connectable to an audio interface by applying a harmonic driving signal to a first contact and a second contact of the audio interface for driving the emitters of the external sensor, receiving the response signal at a third contact of the audio interface, demodulating and demultiplexing the response signal into a first wavelength response signal and a second wavelength response signal, analyzing the first and second wavelength response signals to determine one or more vital signs, and outputting the determined one or more vital signs.

Abstract translation: 提供了方法，系统和相关设备，以使得电子设备能够操作包括用于发射两个不同波长的电磁辐射的一个或多个发射器的外部传感器和用于基于所接收的两个不同波长的可接收电磁辐射产生响应信号的检测器 通过将音频驱动信号施加到音频接口的第一触点和用于驱动外部传感器的发射器的第二触点的音频接口，在音频接口的第三接点处接收响应信号，解调和解复用响应信号 分析第一波长响应信号和第二波长响应信号，分析第一和第二波长响应信号以确定一个或多个生命体征，并输出确定的一个或多个生命体征。

公开(公告)号：WO2007121752A1

公开(公告)日：2007-11-01

申请号：PCT/DK2007/000192

申请日：2007-04-24

Applicant: CAPRES A/S ,  PETERSEN, Christian Leth

Inventor： PETERSEN, Christian Leth

IPC: G01R31/312

CPC classification number: G01R31/312 ,  G01R31/2648

Abstract: A method for accurately determining the sheet resistance and leakage current density of a shallow implant in a semiconductor surface (520) includes making one or more four-point resistance measurements with an induced current below 100 μA on the semiconductor surface (520) with a plurality of electrode spacing sets, at least one set having an average spacing below 100 μm. The sheet resistance and implant leakage is determined through fitting the measured data to theoretical data to within a predetermined error.

Abstract translation: 一种用于准确地确定半导体表面（520）中的浅植入物的薄层电阻和漏电流密度的方法包括：在半导体表面（520）上形成多个具有低于100μA的感应电流的四点电阻测量，其中多个 的电极间隔组，至少一个平均间隔小于100μm的组。 通过将测量数据与理论数据拟合到预定误差内来确定薄片电阻和植入物泄漏。

公开(公告)号：WO0003252A3

公开(公告)日：2000-04-13

申请号：PCT/DK9900391

申请日：1999-07-08

Applicant: CAPRES APS ,  PETERSEN CHRISTIAN LETH ,  GREY FRANCOIS ,  BOEGGILD PETER

Inventor： PETERSEN CHRISTIAN LETH ,  GREY FRANCOIS ,  BOEGGILD PETER

IPC: G01R1/073 ,  G01N13/12 ,  G01N13/16 ,  G01R1/06 ,  G01R1/067 ,  G01R27/02 ,  G01R27/04 ,  G01R27/14 ,  G01R31/26 ,  G01R31/28 ,  H01L21/66

CPC classification number: G01R1/06733 ,  G01R1/06711 ,  G01R1/06727 ,  G01R1/06755 ,  G01R1/07307 ,  G01R27/04 ,  G01R27/14 ,  G01R31/2648 ,  G01R31/2831

Abstract: An object of the present invention is to provide a novel testing probe allowing the testing of electronic circuits of a smaller dimension as compared to the prior art testing technique. A particular advantage of the present invention is related to the fact that the novel testing technique involving a novel multi-point probe (12, 14, 16, 18) allows the probe to be utilised for establishing a reliable contact between any testing pin or testing tip and a specific location of a test sample, as the testing probe according to the present invention includes individually bendable or flexible testing pins (14, 18). A particular feature of the present invention relates to the fact that the testing probe according to the present invention may be produced in a process compatible with the production of electronic circuits, allowing measurement electronics to be integrated on the testing probe, and allowing for tests to be performed on any device fabricated by any appropriate circuit technology involving planar technique, CMOS technique, thick-film technique or thin-film technique and also LSI and VLSI production techniques.

Abstract translation: 本发明的目的是提供一种新颖的测试探针，其允许与现有技术的测试技术相比，测试尺寸较小的电子电路。 本发明的特别的优点在于涉及新颖的多点探针（12,14,16,18）的新型测试技术允许探针用于在任何测试引脚或测试之间建立可靠的接触 尖端和测试样品的特定位置，因为根据本发明的测试探针包括单独的可弯曲或柔性的测试针（14,18）。 本发明的一个特征涉及根据本发明的测试探针可以在与生产电子电路兼容的过程中生产，允许将测量电子学集成在测试探针上，并允许测试 在任何通过涉及平面技术，CMOS技术，厚膜技术或薄膜技术以及LSI和VLSI生产技术的适当电路技术制造的器件上执行。