Abstract:
A method of manufacturing a layer for a plurality of thin film transistors for display manufacturing and an apparatus therefore is described. The method includes sputtering a transparent conductive oxide layer from an indium oxide containing target in a processing gas atmosphere. The processing gas atmosphere (222) comprises water vapor, H 2 , and an inert gas, wherein the content of water vapor is from 1% to 10%, wherein the content of H 2 is from 2.2% to 20.0%, and wherein the content of inert gas is from 55.0% to 96.3 %. The apparatus (200) includes a vacuum chamber (210); one or more indium oxide containing targets (220a, 220b) within the vacuum chamber for sputtering a transparent conductive oxide layer; a gas distribution system (230) for providing a processing gas within the vacuum chamber; and a controller (240) connected to the gas distribution system and configured to execute a program code for conducting the method.
Abstract:
A method for forming a light emitting structure (500) on a substrate (501) is described. The method includes forming a first reflective electrode portion (400), forming an emitter layer (502) over the first reflective electrode portion and forming a second electrode portion (504) over the emitter layer. Forming the first reflective electrode portion (400) includes depositing a first transparent conductive metal oxide layer (401), a reflective metal layer (402) and a second transparent conductive metal oxide layer (403) in a process atmosphere including process gases. The method further includes setting the light absorption properties of the first reflective electrode portion (400) to a light absorption of less than 6% of the incident light by controlling the ratio of O2 content and H2 content of the process gas.
Abstract:
A method of manufacturing a layer for a plurality of thin film transistors for display manufacturing and an apparatus therefore is described. The method includes depositing (101) a layer stack onto a substrate by sputtering a first layer with a first set of processing parameters from an indium oxide containing target; sputtering a second set of processing parameters different from the first set of processing parameters onto the first layer from an indium oxide containing target a second layer with, and patterning (102) the layer stack by etching. The apparatus (200) includes a vacuum chamber (210); one or more indium oxide containing targets (220a, 220b) within the vacuum chamber for sputtering a transparent conductive oxide layer; a gas distribution system (230) for providing a processing gas within the vacuum chamber; and a controller (240) connected to the gas distribution system (230) and configured to execute a program code for conducting the method.