Abstract:
A method of manufacturing a layer for a plurality of thin film transistors for display manufacturing and an apparatus therefore is described. The method includes depositing (101) a layer stack onto a substrate by sputtering a first layer with a first set of processing parameters from an indium oxide containing target; sputtering a second set of processing parameters different from the first set of processing parameters onto the first layer from an indium oxide containing target a second layer with, and patterning (102) the layer stack by etching. The apparatus (200) includes a vacuum chamber (210); one or more indium oxide containing targets (220a, 220b) within the vacuum chamber for sputtering a transparent conductive oxide layer; a gas distribution system (230) for providing a processing gas within the vacuum chamber; and a controller (240) connected to the gas distribution system (230) and configured to execute a program code for conducting the method.
Abstract:
Embodiments of methods for depositing material in features of a substrate have been provided herein. In some embodiments, a method for depositing material in a feature of a substrate includes depositing a material in a feature of a substrate disposed in a process chamber by sputtering a target using a plasma formed from a first gas; and etching the deposited material in the process chamber using a plasma formed from a second gas, different than the first gas, to at least partially reduce overhang of the material in the feature, wherein an atomic mass of the second gas is greater than an atomic mass of the first gas.
Abstract:
The invention relates to a method for depositing a target material onto an organic electrically functional material, which method comprises the steps of: - providing a substrate with an organic electrically functional material, like an emissive electroluminescent layer; - creating a vapor plume of target material by pulsed laser deposition; - depositing a first layer of target material on the organic electrically functional material, while maintaining the maximum particle velocity of the deposited particles below a preset value; and - depositing a second layer of target material on the first layer of target material, while the maximum particle velocity of the deposited particles is above the preset value. The invention also relates to an intermediate product and to an organic light emitting diode.
Abstract:
The invention relates to a method for coating a substrate, preferably a drill, wherein at least one first HiPIMS layer is applied by means of a HiPIMS process. Preferably, at least one second layer is applied to the first HiPIMS layer by means of a coating process that does not contain a HiPIMS process.
Abstract:
Methods for forming interconnect structures are provided herein. In some embodiments, a method for forming an interconnect on a substrate may include depositing a material atop an upper surface of the substrate and atop one or more surfaces of a feature disposed in the substrate by a first deposition process that deposits the material at a faster rate on the upper surface than on a bottom surface of the feature; depositing the material atop the upper surface of the substrate and atop one or more surfaces of the feature by a second deposition process that deposits the material at a greater rate on the bottom surface of the feature than on the upper surface of the substrate; and heating the deposited material to draw the deposited material towards the bottom surface of the feature to at least partially fill the feature with the deposited material.
Abstract:
Methods and apparatus for applying pulsed DC power to a plasma processing chamber are disclosed. In some implementations, frequency of the applied power is varied to achieve desired processing effects such as deposition rate, arc rate, and film characteristics. In addition, a method and apparatus are disclosed that utilize a relatively high potential during a reverse-potential portion of a particular cycle to mitigate possible nodule formation on the target. The relative durations of the reverse- potential portion, a sputtering portion, and a recovery portion of the cycle are adjustable to effectuate desired processing effects.
Abstract:
A power storage device with favorable battery characteristics and a manufacturing method thereof are provided. The power storage device includes at least a positive electrode and a negative electrode provided so as to face the positive electrode with an electrolyte provided therebetween. The positive electrode includes a collector and a film containing an active material over the collector. The film containing the active material contains Li e Fe f P g O h satisfying relations of 3.5 ≤ h / g ≤ 4.5, 0.6 ≤ g / f ≤ 1.1, and 0 ≤ e / f ≤ 1.3 and Li a Fe b P c O d satisfying relations of 3.5 ≤ d / c ≤ 4.5, 0.6 ≤ c / b ≤ 1.8, and 0.7 ≤ a / b ≤ 2.8. The film containing the active material contains the Li a Fe b P c O d satisfying the relations of 3.5 ≤ d / c ≤ 4.5, 0.6 ≤ c / b ≤ 1.8, and 0.7 ≤ a / b ≤ 2.8 in a region which is in contact with the electrolyte.
Abstract translation:提供了具有良好的电池特性的蓄电装置及其制造方法。 蓄电装置至少包括正电极和负电极,所述正电极和负电极设置成面对正电极,其间设置有电解质。 正极包括集电体和在集电体上含有活性材料的膜。 含有活性物质的膜含有满足3.5 = h / g = 4.5,0.6 = g / f = 1.1和0 = e / f = 1.3的关系的Li e Fe f P g O h,Li a Fe b P c O d满足关系3.5 = d / c = 4.5,0.6 = c / b = 1.8,0.7 = a / b = 2.8。 含有活性物质的膜含有满足3.5 = d / c = 4.5,0.6 = c / b = 1.8和0.7 = a / b = 2.8的关系的Li a Fe b P c O d 与电解液接触。