A HAND-HELD DISPENSING DEVICE
    1.
    发明申请
    A HAND-HELD DISPENSING DEVICE 审中-公开
    手持式配电装置

    公开(公告)号:WO2010140937A1

    公开(公告)日:2010-12-09

    申请号:PCT/SE2009/050655

    申请日:2009-06-03

    Abstract: A hand-held dispensing device for dispensing a substance, the device comprising: a dispenser incorporating: i) a dispenser body defining a dispensing chamber for holding the substance; ii) an outlet in communication with the dispensing chamber; iii) a dispensing mechanism for dispensing the contents of the dispensing chamber through the outlet and iv) an actuating member resiliently mounted for movement relative to the dispenser body, against the action of a biasing member, to actuate the dispensing mechanism; the dispenser being operably connected to a handle for manual sliding movement relative to the handle from a non-use position, in which the handle covers the outlet, to an operative position, in which the outlet is uncovered; the device further comprising a locking assembly for releasably locking the dispenser body to the handle in the operative position to prevent said manual sliding movement of the dispenser body, whereby a user may grasp the handle and effect manual movement of the actuating member relative to the handle and the dispenser body, against the action of the biasing member, so as to actuate the dispensing mechanism and dispense the contents of the dispensing chamber through the uncovered outlet.

    Abstract translation: 一种用于分配物质的手持式分配装置,该装置包括:分配器,其包括:i)限定用于保持物质的分配室的分配器主体; ii)与分配室连通的出口; iii)分配机构,用于通过所述出口分配所述分配室的内容物,以及iv)致动构件,其弹性地安装成抵抗所述偏置构件的作用相对于所述分配器主体移动,以致动所述分配机构; 所述分配器可操作地连接到手柄,用于相对于所述手柄的手动滑动运动,所述非使用位置(其中所述手柄将所述出口覆盖在所述出口处)到所述出口未被覆盖的操作位置; 所述装置还包括锁定组件,用于将所述分配器主体可释放地锁定在所述手柄处于所述操作位置,以防止所述分配器主体的所述手动滑动运动,由此使用者可以抓握所述手柄并且致动所述致动构件相对于所述手柄的手动运动 和分配器主体,以抵抗偏置构件的作用,以便致动分配机构并通过未覆盖的出口分配分配室的内容物。

    RECEPTACLE FOR PERSONAL CARE COMPOSITION
    2.
    发明申请
    RECEPTACLE FOR PERSONAL CARE COMPOSITION 审中-公开
    个人护理组合物的补充

    公开(公告)号:WO2009056795A1

    公开(公告)日:2009-05-07

    申请号:PCT/GB2008/003552

    申请日:2008-10-22

    CPC classification number: A45D26/0014 Y10T29/49826

    Abstract: The present invention describes a receptacle (10) for a personal care composition comprising a container (12), a separate closure member (14), at least one applicator means (22) for the application of the composition to a user and at least one removal means (24) for the removal of the composition from a user, wherein: the container comprises a reservoir means for retaining a quantity of composition and an aperture (18) in an upper portion of said container; and wherein the closure member has a hollow construction and a releasably sealable lid member (16), and the interior of the closure member is configured to house the at least one applicator means and the at least one removal means; and wherein securing means (20) are provided to permit the closure member to be releasably engagable with the container to close the aperture when engaged. The present invention also describes a method of applying a personal care composition.

    Abstract translation: 本发明描述了一种用于个人护理组合物的容器(10),其包括容器(12),单独的封闭构件(14),用于将组合物施用于使用者的至少一个施用器装置(22)和至少一个 用于从使用者去除组合物的去除装置(24),其中:所述容器包括用于在所述容器的上部保留一定量的组合物和孔(18)的储存装置; 并且其中所述封闭构件具有中空构造和可释放地密封的盖构件(16),并且所述封闭构件的内部构造成容纳所述至少一个施用装置和所述至少一个移除装置; 并且其中设置固定装置(20)以允许所述封闭构件与所述容器可释放地接合以在接合时封闭所述孔。 本发明还描述了一种应用个人护理组合物的方法。

    DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING OF CONTAMINANTS AND DEFECTS LOCATED BELOW THE SURFACE OF A WAFER OR OTHER WORKPIECE
    3.
    发明申请
    DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING OF CONTAMINANTS AND DEFECTS LOCATED BELOW THE SURFACE OF A WAFER OR OTHER WORKPIECE 审中-公开
    用于非接触式测量污染物和缺陷的差异波长光谱法定位在下面的波形或其他工件的表面

    公开(公告)号:WO2007008430A3

    公开(公告)日:2007-11-01

    申请号:PCT/US2006025257

    申请日:2006-06-28

    Abstract: A method for using photoluminescence to identify defects in a sub-surface region of a sample (16) includes performing a first probe (14) of the sample. A first data set, based on the first probe, is produced indicating defects located primarily in a surface layer of the sample. A second data set, based on a second probe, is produced indicating defects located in both the surface layer and a sub-surface region of the sample. The first data set is subtracted from the second data set to produce a third data set indicating defects located primarily in the sub-surface region of the sample. The first data set may optionally be normalized relative to the second data set before performing the subtraction. The first and second probes may advantageously be performed using a first laser (12) and a second laser, respectively, having different wavelengths from each other.

    Abstract translation: 使用光致发光来鉴定样品(16)的子表面区域中的缺陷的方法包括执行样品的第一探针(14)。 产生基于第一探针的第一数据集,指示主要位于样品的表面层中的缺陷。 产生基于第二探针的第二数据集,其指示位于样品的表面层和次表面区域中的缺陷。 从第二数据组中减去第一数据集以产生指示主要位于样本的子表面区域中的缺陷的第三数据集。 在执行减法之前,第一数据集可以可选地相对于第二数据集进行归一化。 第一和第二探针可以有利地使用分别具有彼此不同波长的第一激光器(12)和第二激光器来执行。

    PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMINESCENCE SIGNALS EMITTED FROM A SPECIFIED MATERIAL LAYER OF A WAFER OR OTHER WORKPIECE
    5.
    发明申请
    PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMINESCENCE SIGNALS EMITTED FROM A SPECIFIED MATERIAL LAYER OF A WAFER OR OTHER WORKPIECE 审中-公开
    光源成像优先检测从指定的WAFER或其他工件的材料层中发出的光致发光信号

    公开(公告)号:WO2007008399A3

    公开(公告)日:2007-12-13

    申请号:PCT/US2006024938

    申请日:2006-06-27

    Abstract: A method and apparatus uses photoluminescence to identify defects in one or more specified material layers of a sample. One or more filtering elements are used to filter out predetermined wavelengths of return light emitted from a sample. The predetermined wavelengths are selected such that only return light emitted from one or more specified material layers of the sample is detected. Additionally or alternatively, the wavelength of incident light directed into the sample may be selected to penetrate the sample to a given depth, or to excite only one or more selected material layers in the sample. Accordingly, defect data characteristic of primarily only the one or more specified material layers is generated.

    Abstract translation: 方法和装置使用光致发光来鉴定样品的一个或多个指定材料层中的缺陷。 一个或多个滤波元件用于滤除从样品发射的预定波长的返回光。 选择预定波长,使得仅检测从样品的一个或多个指定材料层发射的返回光。 另外或替代地,可以选择引入样品的入射光的波长以将样品穿透到给定的深度,或仅激发样品中的一个或多个选定的材料层。 因此,产生仅主要仅一个或多个指定材料层的缺陷数据特性。

    A CHILD RESISTANT CONTAINER
    6.
    发明申请
    A CHILD RESISTANT CONTAINER 审中-公开
    耐儿容器

    公开(公告)号:WO2010089562A1

    公开(公告)日:2010-08-12

    申请号:PCT/GB2010/000209

    申请日:2010-02-04

    Abstract: A child resistant container (10) has a container cavity (20) for the receipt of one or more items to be stored therein. The container cavity (20) is defined by a pair of lids (14, 16) which are hingedly connected to one another. Primary lock means (50) includes a first lock assembly on one lid (14, 16) which engages with a second lock assembly on the other lid (14, 16). A primary lock actuation includes an externally open topped pocket (60) formed in the body of said one lid (14, 16). The pocket (60) has a pocket side wall (62) which is resiliently deflectable from a lock position to an unlock position. The pocket (60) is shaped and sized to permit a finger of an operative to enter the pocket (60) to effect deflection of the pocket side wall (62) to its unlock position.

    Abstract translation: 防儿童容器(10)具有用于接收要存储在其中的一个或多个物品的容器腔(20)。 容器空腔(20)由一对盖子(14,16)限定,它们彼此铰接连接。 主锁定装置(50)包括在一个盖(14,16)上的第一锁定组件,其与另一个盖子(14,16)上的第二锁定组件接合。 主锁定致动包括形成在所述一个盖子(14,16)的主体中的外部打开的顶部凹口(60)。 口袋(60)具有可从锁定位置弹性偏转到解锁位置的袋侧壁(62)。 口袋(60)的形状和尺寸被设计成允许操作的手指进入口袋(60)以实现口袋侧壁(62)到其解锁位置的偏转。

    DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING OF CONTAMINANTS AND DEFECTS LOCATED BELOW THE SURFACE OF A WAFER OR OTHER WORKPIECE
    7.
    发明申请
    DIFFERENTIAL WAVELENGTH PHOTOLUMINESCENCE FOR NON-CONTACT MEASURING OF CONTAMINANTS AND DEFECTS LOCATED BELOW THE SURFACE OF A WAFER OR OTHER WORKPIECE 审中-公开
    用于非接触式测量污染物和缺陷的差异波长光谱法定位在下面的波形或其他工件的表面

    公开(公告)号:WO2007008430A2

    公开(公告)日:2007-01-18

    申请号:PCT/US2006/025257

    申请日:2006-06-28

    Abstract: A method for using photoluminescence to identify defects in a sub-surface region of a sample includes performing a first probe of the sample. A first data set, based on the first probe, is produced indicating defects located primarily in a surface layer of the sample. A second data set, based on a second probe, is produced indicating defects located in both the surface layer and a sub-surface region of the sample. The first data set is subtracted from the second data set to produce a third data set indicating defects located primarily in the sub-surface region of the sample. The first data set may optionally be normalized relative to the second data set before performing the subtraction. The first and second probes may advantageously be performed using a first laser and a second laser, respectively, having different wavelengths from each other.

    Abstract translation: 使用光致发光来鉴定样品的子表面区域中的缺陷的方法包括执行样品的第一探针。 产生基于第一探针的第一数据集,指示主要位于样品的表面层中的缺陷。 产生基于第二探针的第二数据集,其指示位于样品的表面层和次表面区域中的缺陷。 从第二数据组中减去第一数据集以产生指示主要位于样本的子表面区域中的缺陷的第三数据集。 在执行减法之前,第一数据集可以可选地相对于第二数据集进行归一化。 第一和第二探针可以有利地使用分别具有不同波长的第一激光器和第二激光器来执行。

    PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMINESCENCE SIGNALS EMITTED FROM A SPECIFIED MATERIAL LAYER OF A WAFER OR OTHER WORKPIECE
    8.
    发明申请
    PHOTOLUMINESCENCE IMAGING WITH PREFERENTIAL DETECTION OF PHOTOLUMINESCENCE SIGNALS EMITTED FROM A SPECIFIED MATERIAL LAYER OF A WAFER OR OTHER WORKPIECE 审中-公开
    光致发光成像优先检测从晶片或其他工件的指定材料层发射的光致发光信号

    公开(公告)号:WO2007008399A2

    公开(公告)日:2007-01-18

    申请号:PCT/US2006/024938

    申请日:2006-06-27

    Abstract: A method and apparatus uses photoluminescence to identify defects in one or more specified material layers of a sample. One or more filtering elements are used to filter out predetermined wavelengths of return light emitted from a sample. The predetermined wavelengths are selected such that only return light emitted from one or more specified material layers of the sample is detected. Additionally or alternatively, the wavelength of incident light directed into the sample may be selected to penetrate the sample to a given depth, or to excite only one or more selected material layers in the sample. Accordingly, defect data characteristic of primarily only the one or more specified material layers is generated.

    Abstract translation: 一种方法和设备使用光致发光来识别样品的一个或多个指定材料层中的缺陷。 一个或多个滤波元件用于过滤从样本发射的预定波长的返回光。 预定波长被选择为仅检测从样本的一个或多个指定材料层发射的返回光。 另外地或可替代地,可以选择被引导到样本中的入射光的波长以穿透样本到给定深度,或仅激发样本中的一个或多个选定材料层。 因此,主要仅产生一个或多个指定材料层的缺陷数据特征被生成。

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