SYSTEMS AND METHODS FOR SUBSTRATE POLISHING END POINT DETECTION USING IMPROVED FRICTION MEASUREMENT
    2.
    发明申请
    SYSTEMS AND METHODS FOR SUBSTRATE POLISHING END POINT DETECTION USING IMPROVED FRICTION MEASUREMENT 审中-公开
    使用改进的摩擦测量的基板抛光端点检测的系统和方法

    公开(公告)号:WO2013074706A1

    公开(公告)日:2013-05-23

    申请号:PCT/US2012/065127

    申请日:2012-11-14

    CPC classification number: B24B37/013 B24B49/16

    Abstract: Methods, apparatus, and systems for polishing a substrate are provided. The invention includes an upper platen; a torque/strain measurement instrument coupled to the upper platen; and a lower platen coupled to the torque/strain measurement instrument and adapted to drive the upper platen to rotate through the torque/strain measurement instrument. In other embodiments, the invention includes an upper carriage, a side force measurement instrument coupled to the upper carriage, and a lower carriage coupled to the side force measurement instrument and adapted to support a polishing head. Numerous additional aspects are disclosed.

    Abstract translation: 提供了用于抛光衬底的方法,装置和系统。 本发明包括上压板; 耦合到上压板的扭矩/应变测量仪器; 以及耦合到扭矩/应变测量仪器并适于驱动上压板旋转通过扭矩/应变测量仪器的下压板。 在其他实施例中,本发明包括上托架,耦合到上滑架的侧力测量装置和联接到侧力测量仪器并适于支撑抛光头的下托架。 公开了许多附加方面。

    RETAINING RING FOR CMP
    4.
    发明申请
    RETAINING RING FOR CMP 审中-公开
    用于CMP的定位环

    公开(公告)号:WO2018022520A2

    公开(公告)日:2018-02-01

    申请号:PCT/US2017/043551

    申请日:2017-07-24

    Abstract: A retaining ring includes a generally annular body having an inner surface to constrain a substrate and a bottom surface, the bottom surface having a plurality of channels extending from an outer surface to the inner surface, and a plurality of islands separated by the channels and providing a contact area to contact a polishing pad, wherein the contact area is about 15-40% of a plan area of the bottom surface.

    Abstract translation: 保持环包括大致环形的本体,该本体具有限定基底和底表面的内表面,该底表面具有从外表面延伸到内表面的多个通道,以及多个 所述岛由所述通道隔开并且提供接触区域以接触抛光垫,其中所述接触面积为所述底面的平面面积的约15-40%。

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