公开(公告)号：WO2022251016A1

公开(公告)日：2022-12-01

申请号：PCT/US2022/029801

申请日：2022-05-18

Applicant: BRUKER NANO, INC.

Inventor： OSBORNE, Jason ,  HAND, Sean ,  FONOBEROV, Vladimir ,  YOUNG, James

IPC: G01Q60/24 ,  G01Q40/00 ,  G01Q10/04 ,  G01Q10/06

Abstract: An atomic force microscope (AFM) and method of operating the same includes a separate Z height sensor to measure, simultaneously with AFM system control, probe sample distance, pixel-by-pixel during AFM data acquisition. By mapping the AFM data to low resolution data of the Z height data, a high resolution final data image corrected for creep is generated in real time.

公开(公告)号：WO2022216677A1

公开(公告)日：2022-10-13

申请号：PCT/US2022/023440

申请日：2022-04-05

Applicant: BRUKER NANO, INC.

Inventor： FONOBEROV, Vladimir ,  YOUNG, James ,  OSBORNE, Jason ,  HAND, Sean

IPC: G06T5/00 ,  G06T7/11 ,  G06T7/20 ,  G06T5/20

Abstract: A method of operating an atomic force microscope (AFM), using a denoising algorithm, real-time, during AFM data acquisition. Total Variation and Non-Local Means denoising are preferred. Real time images with minimized sensor noise needing no post-image acquisition processing to account for noise as described herein results.