Abstract:
The present invention provides a radiation imaging apparatus comprising a scintillator configured to convert radiation into light, a detector including a plurality of pixels each configured to detect an intensity of light converted by the scintillator and configured to count, for each pixel, the number of times of detection of light at each of a plurality of levels concerning the intensity of light, and a processor configured to perform processing of generating an image based on the number of times of detection at each level obtained for each pixel, wherein the processor corrects the number of times of detection, for each pixel, at each level obtained by using information indicating a relationship between energy of radiation and a probability that the detector will count light at each level, and generates an image based on the corrected numbers of times of detection.
Abstract:
A radiation imaging apparatus is provided. The apparatus comprises a scintillator configured to convert radiation into light, a sensor panel in which a plurality of pixels each comprising a light detector configured to detect the light is arranged in a two-dimensional array, and a processing unit. The processing unit comprises a signal generating unit configured to output signals indicating intensities of the light detected by the light detector of each of the plurality of pixels, and a detection unit configured to identify a group of pixels each of which outputs a signal of a level exceeding a reference value out of the signals and detect, based on a pattern of the group, pileup in which a plurality of radiation photons is detected as a single radiation photon.
Abstract:
A radiation imaging apparatus is provided. The apparatus comprises a scintillator configured to convert radiation into light, a sensor panel in which a plurality of pixels each comprising a light detector configured to detect the light is arranged, and a processing unit. The processing unit comprises a conversion unit configured to output a detection signal in accordance with a signal generated in the light detector by the incident light and radiation that has transmitted through the scintillator without being converted into light, and a reset control unit configured to determine that the light detector detects the transmitted radiation based on a magnitude of the detection signal and reset the conversion unit if the light detector is determined to detect the transmitted radiation.
Abstract:
The present invention provides a radiation image pickup apparatus in which one or more image pickup elements are easily exchanged. A radiation image pickup apparatus includes a base, at least one image pickup element, a scintillator, a first heat peelable adhesive layer which is arranged between the base and the image pickup element and which fixes the base and the image pickup element, and a second heat peelable adhesive layer which is arranged between the image pickup element and the scintillator and which fixes the image pickup element and the scintillator, and in the radiation image pickup element described above, the first heat peelable adhesive layer contains first heat-expandable microspheres, the second heat peelable adhesive layer contains second heat-expandable microspheres, and the first heat-expandable microspheres have a different expansion starting temperature from that of the second heat-expandable microspheres.
Abstract:
A radiation imaging apparatus is provided. The apparatus comprises a scintillator, a sensor panel in which each including a light detector, and a processing unit. The processing unit generates signals in accordance with the light detected by the light detectors, determines whether signals generated in the same period by a pixel group, which includes one pixel of interest and at least one pixel near the pixel of interest out of the pixels, have a specific distribution, obtains a count of the number of times the pixel of interest is determined to have the specific distribution, and obtains, based on a value obtained by converting the count in accordance with a first and a second coefficient, an incident amount of a first and a second energy band out of radiation irradiating the pixel of interest, respectively.
Abstract:
A radiation detecting apparatus includes a substrate 1, a scintillator layer 7 converting a radiation into light, and scintillator protection members 8, 9 and 10 to cover the scintillator layer 7, wherein the scintillator protection member includes a scintillator protection layer 8 consisting of a hot-melt resin, and the scintillator protection layer 8 touches the scintillator layer 7. As the substrate 1, a sensor panel including a photoreceiving layer 15 on which photoelectric conversion elements 2, receiving light, are arranged in two-dimension, and a protection layer 5 provided on the photreceiving layer 15 and touching the scintillator layer 7 and the scintillator protection layer 8. By using such a scintillator protection layer, a film formation time of the scintillator protection layer can be shortened, and the film thickness dispersion of the scintillator protection layer can be suppressed. Moreover, the adhesion property to the scintillator foundation layer and to the reflective layer protection layer can be improved.
Abstract:
A radiation imaging apparatus, including a plurality of pixels, a plurality of column lines and a processor, the plurality of pixels including first pixels and second pixels configured to generate signals of different values by receiving radiation rays of equal irradiation rates, and the plurality of pixels being arrayed such that their numbers are different between a first column and a second column of the plurality of columns, wherein the processor, after radiation irradiation is started, obtains a first signal of the first column and a second signal of the second column while maintaining each pixel to an OFF state and performs AEC based on the first and second signals.
Abstract:
A radiation imaging apparatus that comprises a plurality of sensor units each including a detection element which detects radiation, a quantization unit configured to quantize a signal value from the detection element of each sensor unit, a count unit configured to count, for each sensor unit, the number of matches between a second pattern as a reference pattern set in advance, and a first pattern which includes a quantization result by the quantization unit of the signal value from the detection element of the sensor unit and a quantization result by the quantization unit of the signal value from the detection element of another sensor unit on the periphery of the sensor unit, and a readout unit configured to read out a count value of the count unit.
Abstract:
A radiation detecting apparatus includes: a sensor panel for converting radiation or light into an electric charge; a casing holding the sensor panel; an acceleration detecting unit for detecting an acceleration relating to a movement of the radiation detecting apparatus, and for transmitting a signal based on a value of the acceleration; a determining unit for determining, based on the signal transmitted from the acceleration detecting unit, as to whether the radiation detecting apparatus is in an excessively accelerated state, a free falling state or a normal state; and a buffer unit for operating to absorb a shock exerted on the radiation detecting apparatus, responsive to determination by the determining unit such that the radiation detecting apparatus is in an excessively accelerated state or a free falling state. The buffer unit is arranged outside of the casing.
Abstract:
To reduce peeling between members constituting an radiation detecting apparatus, the radiation detecting apparatus of the present invention includes a laminating layered structure in which a supporting substance, an adhesive layer, an array substrate having a photoelectric conversion element, a scintillator layer for converting a radiation into light and a resin layer are stacked in this order. Of arrangement regions of each layer in a plane direction, an arrangement region of the scintillator layer is broader than the region opposed to a photoelectric conversion element, and an arrangement region of the adhesive layer is the same as or broader than the arrangement region of the photoelectric conversion element and at least a portion of the arrangement region of the adhesive layer is narrower than that of the scintillator layer.