公开(公告)号：WO2021142125A1

公开(公告)日：2021-07-15

申请号：PCT/US2021/012508

申请日：2021-01-07

Applicant: FORMFACTOR, INC.

Inventor： ROSENAUER, Dennis ,  HAYWARD, Roger ,  SWART, Roy

IPC: G01S7/40 ,  H04B7/04 ,  H04B17/00 ,  H04W24/06 ,  H04B17/12 ,  H04B17/16 ,  H04B17/19 ,  H04B7/0617

Abstract: Improved electrical testing of N-port beamforming devices is provided. For testing, an N:1 electrical network is connected to the N ports of the device under test to provide a single test port. This mode of testing can be used to determine parameters of interest (e.g., far field radiation patterns etc.) of the device under test more rapidly than with antenna range testing or with characterization of each port of the device under test. The N:1 electrical network can be passive or active. The N:1 electrical network can be integrated in a probe head to provide probe array testing of beamforming devices. Alternatively, the N:1 electrical network can be integrated with the device under test to provide onboard testing capability.

公开(公告)号：WO2019241530A1

公开(公告)日：2019-12-19

申请号：PCT/US2019/037006

申请日：2019-06-13

Applicant: FORMFACTOR, INC.

Inventor： KISTER, January ,  SWART, Roy ,  SIJERCIC, Edin

IPC: G01R1/02 ,  G01R1/067 ,  G01R31/00 ,  G01R31/02 ,  G01R31/26

Abstract: Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell, In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores, An important application of this approach is to provide impedance matched transmission line probes.