PHOTORESISTS HAVING A LOW LEVEL OF METAL IONS
    1.
    发明申请
    PHOTORESISTS HAVING A LOW LEVEL OF METAL IONS 审中-公开
    具有低水平金属离子的电影

    公开(公告)号:WO1993018437A1

    公开(公告)日:1993-09-16

    申请号:PCT/US1993001749

    申请日:1993-02-25

    CPC classification number: G03F7/004 G03F7/0236

    Abstract: The present invention provides methods for producing photoresist compositions having a very low level of metal ions, utilizing specially treated ion exchange resins. A method is also provided for producing semiconductor devices using such photoresist compositions.

    Abstract translation: 本发明提供了利用特殊处理的离子交换树脂制备具有非常低水平的金属离子的光致抗蚀剂组合物的方法。 还提供了一种用于制造使用这种光致抗蚀剂组合物的半导体器件的方法。

    ACIDIC ION EXCHANGE RESIN AS A CATALYST TO SYNTHESIZE A NOVOLAK RESIN AND PHOTORESIST COMPOSITION THEREFROM
    3.
    发明申请
    ACIDIC ION EXCHANGE RESIN AS A CATALYST TO SYNTHESIZE A NOVOLAK RESIN AND PHOTORESIST COMPOSITION THEREFROM 审中-公开
    ACIDIC离子交换树脂作为催化剂合成NOVOLAK树脂和其中的光电组合物

    公开(公告)号:WO1997025359A1

    公开(公告)日:1997-07-17

    申请号:PCT/US1996020165

    申请日:1996-12-17

    CPC classification number: C08G8/10 G03F7/0236

    Abstract: The present invention provides methods for producing water insoluble, aqueous alkali soluble novolak resins having consistent molecular weight and a very low level of metal ions, utilizing a solid acid condensation catalyst. A method is also provided for producing photoresist composition having a very low level of metal ions from such novolak resins and for producing semiconductor devices using such photoresist compositions.

    Abstract translation: 本发明提供了利用固体酸缩合催化剂生产具有一致分子量和非常低水平的金属离子的水不溶性水溶性酚醛清漆树脂的方法。 还提供了一种用于生产具有来自这种酚醛清漆树脂的非常低水平的金属离子并且使用这种光致抗蚀剂组合物制造半导体器件的光致抗蚀剂组合物的方法。

    METAL ION REDUCTION IN NOVOLAK RESINS
    4.
    发明申请
    METAL ION REDUCTION IN NOVOLAK RESINS 审中-公开
    NOVOLAK树脂中的金属离子减少

    公开(公告)号:WO1993012152A1

    公开(公告)日:1993-06-24

    申请号:PCT/US1992010834

    申请日:1992-12-15

    CPC classification number: C08G8/08 G03F7/0236

    Abstract: The present invention provides methods for producing water insoluble, aqueous alkali soluble novolak resins having a very low level of metal ions, utilizing treated ion exchange resins. A method is also provided for producing photoresist composition having a very low level of metal ions from such novolak resins and for producing semiconductor devices using such photoresist compositions.

    Abstract translation: 本发明提供了利用处理的离子交换树脂生产具有非常低的金属离子含量的水不溶性水溶性酚醛清漆树脂的方法。 还提供了一种用于生产具有来自这种酚醛清漆树脂的非常低水平的金属离子并且使用这种光致抗蚀剂组合物制造半导体器件的光致抗蚀剂组合物的方法

    NOVOLAK RESIN BLENDS FOR PHOTORESIST APPLICATIONS
    5.
    发明申请
    NOVOLAK RESIN BLENDS FOR PHOTORESIST APPLICATIONS 审中-公开
    NOVOLAK树脂用于光电子学应用

    公开(公告)号:WO1994014893A1

    公开(公告)日:1994-07-07

    申请号:PCT/US1993012407

    申请日:1993-12-20

    CPC classification number: G03F7/0236 C08G8/08 C08L61/06 C08L61/04

    Abstract: The present invention relates to a water insoluble, aqueous alkali soluble novolak resin blend, wherein the resin blend comprises two novolaks having dissimilar relative molecular weights and similar dissolution rates, a process for producing such a resin blend, a photoresist containing such a resin blend and a method for producing a semi-conductor device utilizing such a photoresist.

    Abstract translation: 本发明涉及一种不溶于水的碱溶性酚醛清漆树脂混合物,其中树脂共混物包含具有不同相对分子量和相似溶解速率的两种酚醛清漆,制备这种树脂共混物的方法,含有这种树脂共混物的光致抗蚀剂, 一种利用这种光致抗蚀剂制造半导体器件的方法。

    METAL ION REDUCTION IN TOP ANTI-REFLECTIVE COATINGS FOR PHOTORESISTS
    6.
    发明申请
    METAL ION REDUCTION IN TOP ANTI-REFLECTIVE COATINGS FOR PHOTORESISTS 审中-公开
    用于光电元件的顶级抗反射涂层中的金属离子减少

    公开(公告)号:WO1994001807A1

    公开(公告)日:1994-01-20

    申请号:PCT/US1993006139

    申请日:1993-06-24

    CPC classification number: G03F7/091

    Abstract: The present invention provides methods for producing top anti-reflective coating compositions having a very low level of metal ions, utilizing specially treated ion exchange resins. A method is also provided for producing semiconductor devices using such top anti-reflective coating compositions.

    Abstract translation: 本发明提供了利用特殊处理的离子交换树脂生产具有非常低水平金属离子的顶部抗反射涂料组合物的方法。 还提供了一种用于制造使用这种顶部抗反射涂层组合物的半导体器件的方法。

    PROCESS FOR PRODUCING A DEVELOPER HAVING A LOW METAL ION LEVEL
    8.
    发明申请
    PROCESS FOR PRODUCING A DEVELOPER HAVING A LOW METAL ION LEVEL 审中-公开
    用于生产具有低金属离子水平的开发商的方法

    公开(公告)号:WO1994015262A1

    公开(公告)日:1994-07-07

    申请号:PCT/US1993012405

    申请日:1993-12-20

    CPC classification number: G03F7/32

    Abstract: The present invention provides a process for producing a developer containing a surfactant which contains a very low level of metal ions and a process for developing light sensitive photoresist compositions, using such a developer, to produce semiconductor devices.

    Abstract translation: 本发明提供一种制备包含含有非常低水平的金属离子的表面活性剂的显影剂的方法和使用这种显影剂显影光敏性光刻胶组合物以制备半导体器件的方法。

    USING A LEWIS BASE TO CONTROL MOLECULAR WEIGHT OF NOVOLAK RESINS
    9.
    发明申请
    USING A LEWIS BASE TO CONTROL MOLECULAR WEIGHT OF NOVOLAK RESINS 审中-公开
    使用LEWIS基础控制NOVOLAK树脂的分子量

    公开(公告)号:WO1994014862A1

    公开(公告)日:1994-07-07

    申请号:PCT/US1993012403

    申请日:1993-12-20

    CPC classification number: C08G8/08 G03F7/0236

    Abstract: The present invention provides methods for producing water insoluble, aqueous alkali soluble novolak resins having a precise and consistent molecular weight, by adjusting the concentration of Lewis base. A method is also provided for producing photoresist composition from such novolak resins and for producing semiconductor devices using such photoresist compositions.

    Abstract translation: 本发明提供了通过调节路易斯碱的浓度来制备具有精确和一致分子量的水不溶性水溶性酚醛清漆树脂的方法。 还提供了用于由这种酚醛清漆树脂制造光致抗蚀剂组合物并用于制备使用这种光致抗蚀剂组合物的半导体器件的方法。

    POLYPHOSPHAZENE BINDER RESINS FOR PHOTORESISTS
    10.
    发明申请
    POLYPHOSPHAZENE BINDER RESINS FOR PHOTORESISTS 审中-公开
    聚对苯二甲酸丁二酯树脂

    公开(公告)号:WO1993012468A1

    公开(公告)日:1993-06-24

    申请号:PCT/US1992010836

    申请日:1992-12-15

    CPC classification number: C08G79/025 G03F7/0233 Y10S430/106

    Abstract: This invention relates to novel radiation sensitive compositions. More particularly the invention relates to photoresists containing phosphorus and nitrogen linked polymers; i.e., polyphosphazenes, useful in the preparation of a relief pattern on a substrate; e.g., a silicon wafer or aluminum plate. The polyphosphazenes of this invention can be synthesized by the condensation of N-trimethylsilyalkoxyphosphorimides. Radiation sensitive positive photoresist compositions of the invention can be developed in aqueous base developer or organic solvent developer. The base developer dissolution properties of the composition can be controlled by incorporating carboxylate groups into the polyphosphazene. The polyphosphazenes utilized in this invention have good solubility properties in various organic solvents and also have good mechanical, electrical, adhesion and thermal properties.

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