Abstract:
Systems and methods for adjusting a phase step size of a clock data recover (CDR) circuit are described according to aspects of the present disclosure. In certain aspects, a method for adjusting a phase step size of a CDR circuit includes sensing a frequency offset of the CDR circuit, and adjusting the phase step size of the CDR circuit based on the sensed frequency offset. The frequency offset may be sensed by sensing a signal level on an integration path of a loop filter of the CDR circuit. The phase step size of the CDR circuit may be adjusted by switching the CDR circuit between a first phase step size and a second phase step size using a modulator (e.g., a sigma-delta modulator).
Abstract:
An output driver for electrostatic discharge (ESD) protection includes a first pair of stacked metal oxide semiconductor field-effect transistor (MOS) devices coupled between a power terminal and a first differential output terminal. The output driver also includes a second pair of stacked MOS devices coupled between a second differential output terminal and a ground terminal.
Abstract:
Techniques for converting a signal from a small-signal format into a rail-to-rail format are described herein. In one embodiment, a receiver comprises a voltage-level shifter configured to shift a common-mode voltage of a differential signal to obtain a level-shifted differential signal, an amplifier configured to amplify the level-shifted differential signal into an amplified differential signal, and a driver stage configured to convert the amplified differential signal into a rail-to-rail signal. The receiver also comprises a common-mode feedback circuit configured to generate a feedback voltage that is proportional to an output common-mode voltage of the amplifier, and to generate a bias voltage for input to the amplifier based on a difference between the feedback voltage and a reference voltage, wherein the output common-mode voltage of the amplifier depends on the bias voltage.
Abstract:
A differential voltage mode driver for implementing symmetric single ended termination includes an output driver circuitry having a predefined termination impedance. The differential voltage mode driver also includes an output driver replica having independently controlled first and second portions. The first and second portions are independently controlled to establish a substantially equal on-resistance of the first and the second portions. The output driver replica controls the predefined termination impedance of the output driver circuitry.
Abstract:
System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent clock data patterns are driven on one or more of remaining data paths of the plurality of data paths, wherein the coherent clock data patterns are in coherence with a low speed base clock. The first high speed data path is sampled by the coherent clock data patterns to generate a sampled first high speed data path, which is then tested at a speed of the low speed base clock.
Abstract:
A data transmitter includes: a plurality of parallel driver slices, a first slice of the plurality of parallel driver slices having a first signal generator circuit with a first transistor coupled to a data signal and in series with a second transistor coupled to a first bias signal; and a first bias circuit including a third transistor and a fourth transistor in series with a first current source, the first bias circuit further including a first operational amplifier (op amp) having a first input coupled to a first reference voltage and a second input coupled between the fourth transistor and the first current source, an output of the first op amp configured to provide the first bias signal to the second transistor and to the third transistor.
Abstract:
A bias structure includes a reference voltage node connected to gate structures of a first NMOS transistor and a second NMOS transistor, a bias voltage node comprising a bias voltage, and a first op amp having a first input connected to the reference voltage, a second input connected to a drain of the first NMOS transistor, and an output connected to gate structures of a first PMOS transistor and a second PMOS transistor. The bias structure further includes a second op amp having a first input connected to the reference voltage, a second input connected to a drain of the second NMOS transistor, and an output connected to a gate structure of a third NMOS transistor and the bias voltage node. The first NMOS transistor matches a transistor of a differential pair of an integrated circuit device.
Abstract:
A multi-terminal output with a common mode connection includes an output having a first terminal and a second terminal and having a common mode connection between the first terminal and the second terminal. A bulk connection of a transistor is coupled to the common mode connection. A first set of control signals and a second set of control signals are generated. Each of the first set of control signals has a first rail voltage level associated with a first power domain. The second set of control signals is generated from the first set of control signals. Each of the second set of control signals has a second rail voltage level that is associated with a second power domain. The second power domain is associated with a common mode voltage of outputs of an output driver.
Abstract:
In one embodiment, a receiver comprises a latch configured to receive a data signal and to latch symbols of the received data signal, and a decision feedback equalizer. The decision feedback equalizer comprises a first feedback capacitor having first and second terminals, the first terminal being coupled to a first internal node of the latch. The decision feedback equalizer also comprises a first plurality of switches configured to alternatively couple the second terminal of the first feedback capacitor to a first feedback signal and a ground, the first feedback signal having a first voltage that is a function of a bit decision corresponding to a first previous symbol in the data signal preceding a current symbol in the data signal.
Abstract:
An apparatus is provided. The apparatus includes a calibration circuit (200) configured to generate a reference signal (VREF) and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit (200) may be configured to generate the reference signal (VREF) independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal (VREF) and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal (VREF) may be generated independently of the at least one differential circuit.