Abstract:
Apparatus and methods for controlling contamination of components contained within the high- vacuum chambers of mass spectrometer systems are provided. The apparatus and methods employ a beam of neutral gas injected in a contra-flow configuration to incoming particle stream from the ionization chamber. The contra-flow can be in the directly opposite counter-flow direction (e.g., 180 degrees) or at a cross-flow angle to the incoming ion stream (e.g., flowing at an angle between about 10 degrees and 170 degrees). The contra-flow disrupts the axial gas flow and diverts neutral molecules and other undesirable contaminants before they reach the high vacuum stages (e.g., beyond the IQ0 orifice) of the spectrometer. By reducing the transmission of contaminants into the sensitive components housed deep within the mass spectrometer, the present invention can increase throughput, improve robustness, and/or decrease the downtime typically required to vent/disassemble/clean the fouled components.
Abstract:
A field terminator includes a plurality of electrode plates positioned around a guide axis at a radial distance therefrom. The plates generate a quadrupole DC field such that a polarity on each plate is opposite to a polarity on the plates adjacent thereto. The plates may be positioned at an axial end of a quadrupole ion guide such as a mass filter. In addition to an RF field, the ion guide may generate a quadrupole DC field. The DC field of the plates may be opposite in polarity to that of the ion guide.
Abstract:
An ion transfer apparatus for transferring ions from an ion source at a first pressure, which first pressure is >500 mbar, suitably atmospheric pressure, along a path towards a mass spectrometer at a lower second pressure, comprising a plurality of pressure- control chambers each comprising an ion inlet opening for receiving therein ions from said ion source on said path and an ion outlet opening for outputting said ions on said path; wherein said plurality of pressure-control chambers are arranged in succession along said path whereby a said ion outlet opening of each pressure-control chamber is in flow communication with a said ion inlet opening of a successive adjacent pressure- control chamber; a pump apparatus in flow communication with each said pressure- control chamber via a respective plurality of pressure exhaust openings formed within each said pressure-control chamber, and arranged to control the pressure in each respective pressure-control chamber to be lower than the pressure in a preceding adjacent pressure-control chamber such that the pressure in a last of said pressure- control chambers is the lowest amongst the plurality of pressure-control chambers.
Abstract:
Certain embodiments described herein are directed to reflectron assemblies and methods of producing them. In some configurations, a reflectron comprising a plurality of lenses each comprising a planar body and comprising a plurality of separate and individual conductors spanning a central aperture from a first side to a second side of a first surface of the planar body is described. In some instances, the plurality of conductors are each substantially parallel to each other and are positioned in the same plane.
Abstract:
There is provided an interface for use in sampling ions in a mass spectrometer, the interface being arranged for receiving a quantity of ions from an ion source and forming more than one ion beam therefrom, each ion beam being directed along a respective desired pathway.
Abstract:
An ion regulator for a mass spectrometer may include: a first extraction lens having a first hole through which ions can pass; and a second extraction lens electrically isolated from the first extraction lens and having a second hole which is aligned with the first hole so that the ions passing through the first hole can pass therethrough. The surface of the first hole may be inclined with respect to the moving direction of the ions. Use of the ion regulator will simplify the overall structure of a mass spectrometer and control parameters therefor, and will allow the development of a reliable and efficient compact mass spectrometer.
Abstract:
Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.
Abstract:
Apparatus, methods and systems are provided to inhibit a sightline from a charged particle source to an analyzer and for changing a baseline offset of an output spectrum of an analyzer. A supply of charged particles is directed through a hollow body of a deflector lens that is positioned relative to a charged particle source and an analyzer. A flow path along a preferred flow path through a deflector lens permits passage of the ions from the source to the detector while inhibiting a sightline from the detector to the source in a direction parallel to the central longitudinal axis of the deflector lens.