摘要:
Described herein are methods and subsystems for use with a timing generator having an output driver at which a timing signal having timing pulses is output. A method includes controlling the timing generator to cause the output driver to output a timing signal having an expected duty cycle, and filtering the timing signal to produce a DC voltage having a magnitude indicative of an actual duty cycle of the timing signal. The method also includes converting the DC voltage to a digital value indicative of the actual duty cycle of the timing signal. The method can also include comparing the digital value to an expected value corresponding to the expected duty cycle, and using results of the comparing to determine an error associated with the timing generator and/or produce a calibration table that can be used to calibrate the timing generator and/or calibrate a measurement made using the timing generator.
摘要:
An on-vehicle electronic device has a generating unit configured to generate a first clock for data communication with another on-vehicle electronic device through a CXPI communication network; and an adjusting unit configured to adjust a duty width of the first clock.
摘要:
A driver circuit includes an output driver (308) including a plurality of output driver legs. The driver circuit further includes a duty cycle adjuster (316) configured to adjust a duty cycle of a signal provided to the output driver. The driver circuit further includes an isolation module (320) configured to isolate at least one output driver leg of the output driver legs from remaining output driver legs of the output driver legs. The driver circuit further includes a duty cycle monitor configured to monitor an output of the at least one output driver leg when the at least one output driver leg is isolated from the remaining output driver legs, and to provide the monitored output to the duty cycle adjuster.
摘要:
A duty cycle correction (DCC) circuit ( 100) includes a master delay line ( 104) that receives an input clock (102) and determines a period of the input clock (102). A calibration module (106) is coupled to the master delay line (104) and generates a calibration code based on a desired duty cycle and the period of the input clock. A slave delay line (108) generates a delayed input clock (109) based on the input clock (102) and the calibration code. A clock generation module (110) generates an output clock (112), having the desired duty cycle, in response to the input clock (102) and the delayed input clock (109).
摘要:
Exemplary embodiments are related to a clock doubler. A device may include a duty cycle correction circuit configured to receive an input clock signal and convey a corrected clock signal. The duty cycle correction circuit may include a first circuit to convey an output voltage during a first cycle of the input clock signal and correct a current mismatch of the first circuit during a second cycle of the input clock signal. The duty cycle correction circuit may also include a second circuit to convey the output voltage during the second cycle and correct a current mismatch of the second circuit during the first cycle. Further, the device may include a clock generator for receiving the corrected clock signal and generating an output clock.
摘要:
Systems and methods are disclosed including a duty cycle module having two timer circuits to measure pulse widths of a clock signal Two comparators are used to generate control signals depending upon comparisons of the pulse width measurements, in response to the control signals, either the clock signal or an inverted clock signal may be programmably delayed such that combination of the clock signal and the inverted clock signal results in a corrected clock signal Systems and methods are also disclosed for verifying operation of a duty cycle module.
摘要:
Described herein are an apparatus, system, and method for compensating voltage swing and duty cycle of a signal on an input-output (I/O) pad of a processor by adjusting the voltage swing and duty cycle of the signal. The apparatus comprises a driver to transmit a signal on an I/O pad, the signal on the I/O pad having a voltage swing and a duty cycle; and an adjustment unit, coupled to the driver, to receive the signal from the I/O pad transmitted by the driver and to generate voltage swing and duty cycle control signals for adjusting the voltage swing and duty cycle of the signal on the I/O pad respectively. Described herein is also an analog-to-digital (A2D) converter for measuring and/or calibrating various signal attributes including current, voltage, and time.
摘要:
Integrated circuits that support dual-edge clocking are provided. Integrated circuits may include phase-locked loops that generate square-wave clock signals. The clock signals may be provided from off-chip equipment through input-output pins. The clock signals may be routed through a clock distribution network to provide local clock signals to pulse generators that generate clock pulses on rising and falling clock edges. The pulse generators may generate clock pulses that are triggered by the rising and falling clock edges with a common pulse width for optimum performance. Duty cycle distortion introduced by the clock network may be minimized for optimum performance. Adaptive duty cycle distortion circuitry may be used to control the pull- up/pull-down drive strengths of the clock buffer so that the high clock phase of the local clock signals is approximately a half clock cycle.
摘要:
An inductor architecture for resonant clock distribution networks is proposed. This architecture allows for the adjustment of the natural frequency of a resonant clock distribution network by selective decoupling of inductors, so that it achieves energy-efficient operation at multiple clock frequencies. The proposed architecture is primarily targeted at the design of resonant clock networks with integrated inductors and exhibits no area overheads. Such an architecture is generally applicable to semiconductor devices with multiple clock frequencies, and high-performance and low-power clocking requirements such as microprocessors, ASICs, and SOCs. Moreover, it is applicable to the binning of semiconductor devices according to achievable performance levels.