Abstract:
A metal-dielectric bonding method includes providing a first semiconductor structure including a first semiconductor layer, a first dielectric layer on the first semiconductor layer, and a first metal layer on the first dielectric layer, where the first metal layer has a metal bonding surface facing away from the first semiconductor layer; planarizing the metal bonding surface; applying a plasma treatment on the metal bonding surface; providing a second semiconductor structure including a second semiconductor layer, and a second dielectric layer on the second semiconductor layer, where the second dielectric layer has a dielectric bonding surface facing away from the second semiconductor layer; planarizing the dielectric bonding surface; applying a plasma treatment on the dielectric bonding surface; and bonding the first semiconductor structure with the second semiconductor structure by bonding the metal bonding surface with the dielectric bonding surface.
Abstract:
The present invention relates to compositions displaying stress relaxation at the polymer- filler interface. The adaptive interface (AI) formed by coupling moieties capable of dynamic covalent chemistry (DCC) within the polymer-filler interface promotes stress relaxation and yields tough, and healable composites.
Abstract:
A family of digital logic functions has the same specifications for input and output voltages and the same number of bond pads. A digital logic integrated circuit (1100) for the family includes: a substrate of semiconductor material having a core area (1104) and a peripheral area; a certain number of bond pads (1106-1 through 1106-14) formed in the peripheral area, the certain number of bond pads determining the total area of the substrate; programmable digital logic transistor circuitry formed in the core area for each of the digital logic functions in the family; programmable input and output circuitry formed in the peripheral area; programming circuitry for programming the programmable digital logic transistor circuitry into a selected digital logic function; and programmable input and output means for programming the input and output circuitry into input and output circuits for the selected digital logic function.
Abstract:
Described examples include a method (100) of making a semiconductor die package. The method (100) comprises arranging (118) at least one preformed die attach pad and at least two preformed leads on a lead frame carrier in a predetermined configuration to form a lead frame, attaching (120) a semiconductor die to the at least one preformed die attach pad, wire bonding (122) the semiconductor die to the at least two preformed leads, forming (124) a molding structure including at least part of the semiconductor die and the at least two preformed leads, and removing (126) the molding structure from the lead frame carrier.
Abstract:
Le circuit comprend au moins une puce électronique (MT, MD), un substrat stratifié et des moyens de dissipation thermique, la puce étant implantée dans le substrat et les moyens de dissipation thermique étant fixés sur des faces opposées du substrat. Conformément à l'invention, les moyens de dissipation thermique comprennent des bus barres formant dissipateurs thermiques (BB H , BB L ) et montés sur les faces opposées du substrat, les bus barres étant formés chacun d'une pluralité de tronçons métalliques (BB1 H , BB2 H , BB3 H , BB4 H ; BB1 L , BB2 L , BB3 L ) fixés à des emplacements espacés et interconnectés entre eux et avec une face de contact de ladite puce électronique (MT, MD) par une couche métallique (ME H , ME L ).
Abstract:
Devices including high-aspect ratio electroplated structures and methods of forming high-aspect ratio electroplated structures are described. A method for manufacturing metal structures includes providing a substrate having a metal base characterized by a height to width aspect ratio A/B and electroplating a metal crown on the base to form the metal structure with a height to width aspect ratio A/S greater than the aspect ratio A/B of the base.
Abstract:
A reduced size non-volatile memory cell array is achieved by forming first trenches in an insulation layer in the row direction, filling the first trenches with insulation material, forming second trenches in the insulation layer in the column direction, forming the STI isolation material in the second trenches, and forming the source regions through the first trenches. Alternately, the STI isolation regions can be made continuous, and the source diffusion implant has sufficient energy to form continuous source line diffusions that each extend across the active regions and under the STI isolation regions. This allows control gates of adjacent memory cell pairs to be formed closer together.