利索-全球专利检索

  1. 登录
  2. 注册
发明公开
CN104849647A 对于电路可靠性老化的方法和装置 无效 - 驳回

对于电路可靠性老化的方法和装置
摘要：
一种用于集成电路可靠性老化仿真的方法，包括：将所述目标时间段划分成N个阶段，包括第一阶段和第二阶段；获取可靠性模型的用于所述第一阶段的第一参数值；对于所述第一阶段，基于所述可靠性模型和所述第一参数值对所述电路进行第一仿真，以获取第一老化结果；获取所述可靠性模型的用于所述第二阶段的第二参数值；以及对于所述第二阶段，基于所述可靠性模型和所述第二参数值对所述电路进行第二仿真，以获取第二老化结果。
摘要（英）：

The invention discloses a method for simulating the reliability aging of a circuit, and the method comprises the steps: enabling a target time period to be divided into N stages which comprise a first stage and a second stage; obtaining a first parameter value, which is used for the first stage, of a reliability model; carrying out the first simulation of the circuit based on the reliability model and the first parameter value for the first stage, so as to obtain a first aging result; obtaining a second parameter value, which is used for the second stage, of the reliability model; and carrying out the second simulation of the circuit based on the reliability model and the second parameter value for the second stage, so as to obtain a second aging result.

0/0