Invention Grant
- Patent Title: Substrate treatment method and substrate treatment apparatus
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Application No.: US14989241Application Date: 2016-01-06
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Publication No.: US10014186B2Publication Date: 2018-07-03
- Inventor: Yuya Akeboshi , Hiroshi Tomita , Hisashi Okuchi , Yasuhito Yoshimizu , Hiroaki Yamada
- Applicant: TOSHIBA MEMORY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2015-111556 20150601
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/3213 ; H01L21/67 ; C23F1/40

Abstract:
In accordance with an embodiment, a substrate treatment method includes bringing a first metallic film on a substrate into contact with a first liquid, mixing a second liquid into the first liquid, and bringing the first metallic film or a second metallic film different from the first metallic film into contact with a liquid in which the first liquid and the second liquid are mixed together to etch the first or second metallic film. The first liquid includes an oxidizing agent, a complexing agent, and water (H2O) of a first content rate to etch the first metallic film. The second liquid includes water (H2O) at a second content rate higher than the first content rate after the etching has started.
Public/Granted literature
- US20160351417A1 SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS Public/Granted day:2016-12-01
Information query
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