- 专利标题: System and method for deforming and analyzing particles
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申请号: US15377659申请日: 2016-12-13
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公开(公告)号: US10107735B2公开(公告)日: 2018-10-23
- 发明人: Dino Di Carlo , Daniel R. Gossett , Henry T. K. Tse , Aram Chung
- 申请人: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- 申请人地址: US CA Oakland
- 专利权人: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- 当前专利权人: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- 当前专利权人地址: US CA Oakland
- 代理机构: Vista IP Law Group LLP
- 主分类号: G01N15/14
- IPC分类号: G01N15/14 ; G06T7/00 ; G06K9/46 ; G01N15/10 ; G01N21/64
摘要:
A system for deforming and analyzing particles includes a substrate defining an inlet, and an outlet; a fluidic pathway fluidly coupled to the inlet and the outlet and defining a delivery region upstream of a deformation region configured to deform particles, wherein the fluidic pathway comprises a first branch configured to generate a first flow, and a second branch configured to generate a second flow that opposes the first flow, wherein an intersection of the first flow and the second flow defines the deformation region; a detection module including a sensor configured to generate a morphology dataset characterizing deformation of the particles, and a photodetector configured to generate a fluorescence dataset characterizing fluorescence of the particles; and a processor configured to output an analysis of the plurality of particles based at least in part on the deformation dataset and the fluorescent dataset for the plurality of particles.
公开/授权文献
- US20170089822A1 SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES 公开/授权日:2017-03-30
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