Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US15290240Application Date: 2016-10-11
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Publication No.: US10177253B2Publication Date: 2019-01-08
- Inventor: Sung-Soo Kim , Gi-Gwan Park , Sang-Koo Kang , Koung-Min Ryu , Jae-Hoon Lee , Tae-Won Ha
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2015-0143541 20151014
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/66 ; H01L29/40 ; H01L29/423 ; H01L29/51

Abstract:
A semiconductor device capable of adjusting profiles of a gate electrode and a gate spacer by implanting or doping an element semiconductor material into an interlayer insulating layer may be provided. The semiconductor device may include a gate spacer on a substrate, the gate spacer defining a trench, a gate electrode filling the trench, and an interlayer insulating layer on the substrate, which surrounds the gate spacer, and at least a portion of which includes germanium.
Public/Granted literature
- US20170110576A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2017-04-20
Information query
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