Invention Grant
- Patent Title: Method for measuring metal ion permeability of polymer film and device for measuring metal ion permeability of polymer film
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Application No.: US15529787Application Date: 2016-01-29
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Publication No.: US10324016B2Publication Date: 2019-06-18
- Inventor: Young Kook Kim , Jung Hak Kim , Hee Jung Kim , Se Ra Kim , Jung Ho Jo , Kwang Joo Lee , Seung Hee Nam , Ji Ho Han
- Applicant: LG CHEM, LTD.
- Applicant Address: KR Seoul
- Assignee: LG CHEM, LTD.
- Current Assignee: LG CHEM, LTD.
- Current Assignee Address: KR Seoul
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: KR10-2015-0014306 20150129; KR10-2015-0014307 20150129
- International Application: PCT/KR2016/001022 WO 20160129
- International Announcement: WO2016/122264 WO 20160804
- Main IPC: G01R15/08
- IPC: G01R15/08 ; G01N27/04 ; G01N27/06 ; G01N27/12 ; G01N27/14 ; G01N27/62 ; G01N15/08 ; G01N27/333 ; G01N13/00

Abstract:
The present invention relates to a method for measuring metal ion permeability of a polymer film, comprising the steps of applying a voltage to the polymer film, while at least one side of the polymer film is brought into contact with an electrolyte comprising metal ions, an organic solvent and an aqueous solvent; and measuring the change rate of resistance or change rate of current of the polymer film according to time, after the voltage is applied, and a device for measuring metal ion permeability of a polymer film used therefor.
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