- 专利标题: Thin film transistor
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申请号: US15846217申请日: 2017-12-19
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公开(公告)号: US10374180B2公开(公告)日: 2019-08-06
- 发明人: Yu-Dan Zhao , Xiao-Yang Xiao , Ying-Cheng Wang , Yuan-Hao Jin , Tian-Fu Zhang , Qun-Qing Li
- 申请人: Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
- 申请人地址: CN Beijing TW New Taipei
- 专利权人: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: CN Beijing TW New Taipei
- 代理机构: ScienBiziP, P.C.
- 优先权: CN201710051877 20170120
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/16 ; H01L29/20 ; H01L29/24 ; H01L29/49 ; H01L51/00 ; H01L51/05 ; H01L51/10 ; H01L29/417 ; H01L29/775 ; H01L29/872 ; B82Y10/00
摘要:
A thin film transistor includes a gate, an insulating medium layer and a Schottky diode. The Schottky diode includes a first electrode, a second electrode and a semiconducting structure. The first electrode is located on the surface of the insulating medium layer and includes a first metal layer and a second metal layer. The second electrode is located on the surface of the insulating medium layer and includes a third metal layer and a fourth metal layer. The semiconductor structure includes a first end and a second end. The first end is sandwiched by the first metal layer and the second metal layer, the second end is sandwiched by the third metal layer and the fourth metal layer. The semiconductor structure includes a carbon nanotube structure.
公开/授权文献
- US20180212174A1 THIN FILM TRANSISTOR 公开/授权日:2018-07-26
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