Invention Grant
- Patent Title: Semiconductor detector
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Application No.: US15625473Application Date: 2017-06-16
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Publication No.: US10388818B2Publication Date: 2019-08-20
- Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: BakerHostetler
- Priority: CN201610797815 20160831
- Main IPC: H01L31/118
- IPC: H01L31/118 ; G01T1/24 ; G01T1/02 ; H01L27/144 ; H01L31/0224 ; H01L31/028 ; H01L31/0296 ; H01L31/0304 ; H01L31/032

Abstract:
There is provided a semiconductor detector. According to an embodiment, the semiconductor detector may include a semiconductor detection material including a first side and a second side opposite to each other. One of the first side and the second side is a ray incident side that receives incident rays. The detector may further include a plurality of pixel cathodes disposed on the first side and a plurality of pixel anodes disposed on the second side. The pixel anodes and the pixel cathodes correspond to each other one by one. The detector may further include a barrier electrode disposed on a periphery of respective one of the pixel cathodes or pixel anodes on the ray incident side. According to the embodiment of the present disclosure, it is possible to effectively suppress charge sharing between the pixels and thus to improve an imaging resolution of the detector.
Public/Granted literature
- US20180062021A1 SEMICONDUCTOR DETECTOR Public/Granted day:2018-03-01
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