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公开(公告)号:US10663607B2
公开(公告)日:2020-05-26
申请号:US15591165
申请日:2017-05-10
Applicant: Nuctech Company Limited
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/36
Abstract: The present disclosure provides an apparatus for processing signals for a plurality of energy regions, and a system and method for detecting radiation of a plurality of energy regions. The apparatus for processing signals for a plurality of energy regions may comprise: a first processor, configured to receive a signal from a detector and process the received signal to generate a gated signal, wherein a turn-on period of the gated signal represents magnitude of the received signal; and a second processor, configured to receive the gated signal from the first processor, and determine one of the plurality of energy regions to which the received signal belongs according to the turn-on period of the gated signal, so as to count signals within the determined energy region.
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公开(公告)号:US10101473B2
公开(公告)日:2018-10-16
申请号:US15606071
申请日:2017-05-26
Applicant: Nuctech Company Limited
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/02 , H05K1/18 , H05K1/02 , H05K1/11 , H01L31/119 , H01L31/0296
Abstract: The present disclosure provides a semiconductor detector. The semiconductor detector comprises: a detector crystal including a crystal body, an anode and a cathode; a field enhance electrode for applying a voltage to the detector crystal; an insulating material disposed between the field enhanced electrode and a surface of the detector crystal. The semiconductor detector further comprises a field enhanced electrode circuit board having a bottom connection layer in contact with the surface of the detector crystal and a top layer opposite to the bottom connection layer, wherein the top layer is connected to a high voltage input terminal of the semiconductor detector, and an insulating material is provided between the bottom connection layer and the detector surface of the detector crystal.
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公开(公告)号:US11812002B2
公开(公告)日:2023-11-07
申请号:US17382236
申请日:2021-07-21
Applicant: NUCTECH COMPANY LIMITED
Inventor: Bicheng Liu , Hao Yu , Weizhen Wang , Guangming Xu , Haojie Chi , Shangmin Sun , Chunguang Zong , Yu Hu
CPC classification number: H04N1/4092 , G06T3/4007 , G06T5/006 , G06T5/50 , G06T7/97 , H04N1/00005 , H04N1/00037 , G06T2207/10008 , G06T2207/20021
Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.
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公开(公告)号:US20220030132A1
公开(公告)日:2022-01-27
申请号:US17382236
申请日:2021-07-21
Applicant: NUCTECH COMPANY LIMITED
Inventor: Bicheng LIU , Hao Yu , Weizhen Wang , Guangming Xu , Haojie Chi , Shangmin Sun , Chunguang Zong , Yu Hu
Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.
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公开(公告)号:US11055869B2
公开(公告)日:2021-07-06
申请号:US16226645
申请日:2018-12-20
Applicant: NUCTECH COMPANY LIMITED
Inventor: Bicheng Liu , Haoran Zhang , Guangming Xu , Qi Wang , Qiangqiang Zhu , Yuan Wo
Abstract: The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.
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公开(公告)号:US20180059262A1
公开(公告)日:2018-03-01
申请号:US15609476
申请日:2017-05-31
Applicant: NUCTECH COMPANY LIMITED
Inventor: Lan ZHANG , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/0224 , H01L31/032
CPC classification number: G01T1/24 , G01T1/241 , H01L31/022408 , H01L31/0324
Abstract: A semiconductor may include a semiconductor detection material including a first side and a second side opposite to each other, a cathode disposed on the first side, and an anode disposed on the second side. The anode includes an array of pixel anodes defining detection pixels of the semiconductor detector, and intermediate anodes disposed between adjacent ones of the pixel anodes. According to an embodiment of the present disclosure, it is possible to achieve signal correction to improve the energy resolution and the signal-to-noise ratio of the detector.
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公开(公告)号:US11346975B2
公开(公告)日:2022-05-31
申请号:US16467140
申请日:2017-08-04
Applicant: NUCTECH COMPANY LIMITED
Inventor: Zhiqiang Chen , Ziran Zhao , Yaohong Liu , Jianping Gu , Qian Yi , Bicheng Liu , Guangming Xu
IPC: G01V5/00 , G01N23/046 , G01T1/29
Abstract: The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method. The spiral CT device includes: an inspection station operable to carry an object to be inspected and defining an inspection space; a rotational supporting apparatus disposed around the inspection space; a plurality of X-ray sources located on the rotational supporting apparatus; and a plurality of X-ray receiving apparatuses located on the rotational supporting apparatus and opposing to the plurality of X-ray sources respectively, wherein the plurality of X-ray sources and the plurality of X-ray receiving apparatuses are rotational synchronously with the rotational supporting apparatus, wherein the plurality of X-ray sources are closely disposed and fan-shaped X-ray beams provided by the plurality of X-ray sources cover the inspection space with a minimum degree of overlapping.
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公开(公告)号:US10884156B2
公开(公告)日:2021-01-05
申请号:US16232082
申请日:2018-12-26
Applicant: NUCTECH COMPANY LIMITED
Inventor: Qi Wang , Bicheng Liu , Guangming Xu
Abstract: The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.
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公开(公告)号:US10646179B2
公开(公告)日:2020-05-12
申请号:US15720502
申请日:2017-09-29
Applicant: NUCTECH COMPANY LIMITED
Inventor: Guangming Xu , Bicheng Liu , Ziran Zhao , Lan Zhang , Jianping Gu
Abstract: The present disclosure provides a method for recognizing an article using a multi-energy spectrum X-ray imaging system and a multi-energy spectrum X-ray imaging system. The method comprises: recognizing an application scenario and/or priori information of the article; selecting a parameter mode suitable for the article from a plurality of parameter modes stored in the multi-energy spectrum X-ray imaging system based on the recognized application scenario and/or priori information; and recognizing the article using the selected parameter mode, wherein the plurality of parameter modes are obtained by optimizing system parameters of the multi-energy spectrum X-ray imaging system under a specific condition using a training sample library for various articles.
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公开(公告)号:US10295679B2
公开(公告)日:2019-05-21
申请号:US15609476
申请日:2017-05-31
Applicant: NUCTECH COMPANY LIMITED
Inventor: Lan Zhang , Yingshuai Du , Bo Li , Zonggui Wu , Jun Li , Xuepeng Cao , Haifan Hu , Jianping Gu , Guangming Xu , Bicheng Liu
IPC: G01T1/24 , H01L31/0224 , H01L31/032
Abstract: A semiconductor may include a semiconductor detection material including a first side and a second side opposite to each other, a cathode disposed on the first side, and an anode disposed on the second side. The anode includes an array of pixel anodes defining detection pixels of the semiconductor detector, and intermediate anodes disposed between adjacent ones of the pixel anodes. According to an embodiment of the present disclosure, it is possible to achieve signal correction to improve the energy resolution and the signal-to-noise ratio of the detector.
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