Invention Grant
- Patent Title: Substrate processing device and method of manufacturing semiconductor device
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Application No.: US15989887Application Date: 2018-05-25
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Publication No.: US10403524B2Publication Date: 2019-09-03
- Inventor: Shinsuke Muraki , Hiroaki Yamada , Yuya Akeboshi , Katsuhiro Sato
- Applicant: TOSHIBA MEMORY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2016-182167 20160916
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/3213 ; H01L21/306 ; H01L21/28 ; C23F1/16 ; C23F1/26

Abstract:
A substrate processing device capable of stabilizing an etching amount of a metal film provided on a substrate is provided. The substrate processing device includes a first container, a second container and a control unit. The first container stores a first liquid in which an acid solution containing phosphoric acid and water are mixed. The first liquid is capable of etching a metal film provided on a substrate. The second container stores a second liquid containing water. The control unit controls supply of the second liquid from the second container to the first container such that a water concentration of the first liquid increases over time corresponding to change in a concentration of the phosphoric acid in the first liquid.
Public/Granted literature
- US20180277407A1 SUBSTRATE PROCESSING DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2018-09-27
Information query
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