Invention Grant
- Patent Title: Magnetoresistance effect element and magnetic memory device
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Application No.: US15810896Application Date: 2017-11-13
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Publication No.: US10410703B2Publication Date: 2019-09-10
- Inventor: Shunsuke Fukami , Toru Iwabuchi , Hideo Ohno , Tetsuo Endoh
- Applicant: TOHOKU UNIVERSITY
- Applicant Address: JP Sendai-shi, Miyagi
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai-shi, Miyagi
- Agency: Rabin & Berdo, P.C.
- Priority: JP2015-098976 20150514
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/02 ; H01L43/08 ; G01R33/09 ; G11C7/10 ; G11C11/16 ; H01F1/00 ; H01F10/32 ; B82Y10/00 ; B82Y25/00

Abstract:
A magnetoresistance effect element includes a recording layer containing a ferromagnetic body, and including a first fixed and second magnetization regions having magnetization components fixed substantially in a direction antiparallel to the in-plane direction to each other, and a free magnetization region disposed between the first and second fixed magnetization regions and having a magnetization component invertible in the in-plane direction, a domain wall disposed between the first fixed magnetization region and the free magnetization region, and being movable within the free magnetization region, and a magnetic nanowire having a width of 40 nm or less. The thickness of the recording layer is 40 nm or less and at least half but no more than twofold the width of the magnetic nanowire. The element further includes a barrier layer disposed on the recording layer, and a reference layer disposed on the barrier layer and containing a ferromagnetic body.
Public/Granted literature
- US20180108390A1 MAGNETORESISTANCE EFFECT ELEMENT AND MAGNETIC MEMORY DEVICE Public/Granted day:2018-04-19
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