Invention Grant
- Patent Title: Integrated circuit device
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Application No.: US15937093Application Date: 2018-03-27
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Publication No.: US10522537B2Publication Date: 2019-12-31
- Inventor: Changhwa Kim , Kyungin Choi , Hwichan Jun , Inchan Hwang
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0121465 20160922
- Main IPC: H01L27/08
- IPC: H01L27/08 ; H01L27/088 ; H01L21/768 ; H01L21/02 ; H01L21/8234 ; H01L23/528 ; H01L27/02 ; H01L29/51 ; H01L29/66 ; H01L29/78 ; H01L21/3115 ; H01L21/311

Abstract:
An integrated circuit device includes a substrate including a device active region, a fin-type active region protruding from the substrate on the device active region, a gate line crossing the fin-type active region and overlapping a surface and opposite sidewalls of the fin-type active region, an insulating spacer disposed on sidewalls of the gate line, a source region and a drain region disposed on the fin-type active region at opposite sides of the gate line, a first conductive plug connected the source or drain regions, and a capping layer disposed on the gate line and extending parallel to the gate line. The capping layer includes a first part overlapping the gate line, and a second part overlapping the insulating spacer. The first and second parts have different compositions with respect to each other. The second part contacts the first part and the first conductive plug.
Public/Granted literature
- US20180219010A1 INTEGRATED CIRCUIT DEVICE Public/Granted day:2018-08-02
Information query
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