Invention Grant
- Patent Title: Semiconductor device having a drain electrode contacting an epi material inside a through-hole and method of manufacturing the same
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Application No.: US16137235Application Date: 2018-09-20
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Publication No.: US10608102B2Publication Date: 2020-03-31
- Inventor: Hokyun Ahn , Min Jeong Shin , Jeong Jin Kim , Hae Cheon Kim , Jae Won Do , Byoung-Gue Min , Hyung Sup Yoon , Hyung Seok Lee , Jong-Won Lim , Sungjae Chang , Hyunwook Jung , Kyu Jun Cho , Dong Min Kang , Dong-Young Kim , Seong-Il Kim , Sang-Heung Lee , Jongmin Lee , Hong Gu Ji
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2017-0128070 20170929; KR10-2018-0046336 20180420
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/45 ; H01L29/778 ; H01L29/66 ; H01L21/3065 ; H01L29/417 ; H01L29/06 ; H01L29/20 ; H01L29/423

Abstract:
Provided is a semiconductor device including a substrate in which an insulation layer is disposed between a first semiconductor layer and a second semiconductor layer, a through-hole penetrating through the substrate, the through-hole having a first hole penetrating through the first semiconductor layer and a second hole penetrating through the insulation layer and the second semiconductor layer from a bottom surface of the first hole, an epi-layer disposed inside the through-hole, a drain electrode disposed inside the second hole and contacting one surface of the epi-layer, and a source electrode and a gate electrode which are disposed on the other surface of the epi-layer.
Public/Granted literature
- US20190103483A1 SEMICONDUCTOR DEVICE AND A METHOD FOR MANUFACTURING THE SAME Public/Granted day:2019-04-04
Information query
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