Invention Grant
- Patent Title: Nonvolatile memory device configured to adjust a read parameter based on a degradation level
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Application No.: US16154111Application Date: 2018-10-08
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Publication No.: US10665312B2Publication Date: 2020-05-26
- Inventor: Jin Bae Bang , Seung Hwan Song , Dae Seok Byeon , Il Han Park , Hyun Jun Yoon , Han Jun Lee , Na Young Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@28022cf9
- Main IPC: G11C27/00
- IPC: G11C27/00 ; G11C11/56 ; G06F11/10 ; G11C16/28 ; G06F3/06 ; G11C16/26 ; G11C16/04

Abstract:
A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.
Public/Granted literature
- US20190287629A1 NONVOLATILE MEMORY DEVICE Public/Granted day:2019-09-19
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