Invention Grant
- Patent Title: Semiconductor wafer thinning systems and related methods
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Application No.: US16448540Application Date: 2019-06-21
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Publication No.: US10665458B2Publication Date: 2020-05-26
- Inventor: Michael J. Seddon , Thomas Neyer
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Adam R. Stephenson, Ltd.
- Main IPC: H01L21/04
- IPC: H01L21/04 ; B24B37/20 ; H01L21/67

Abstract:
Semiconductor substrate thinning systems and methods. Implementations of a method of thinning a semiconductor substrate may include: providing a semiconductor substrate having a first surface and a second surface opposing the first surface and inducing damage into a portion of the semiconductor substrate adjacent to the second surface forming a damage layer. The method may also include backgrinding the second surface of the semiconductor substrate.
Public/Granted literature
- US20190326117A1 SEMICONDUCTOR WAFER THINNING SYSTEMS AND RELATED METHODS Public/Granted day:2019-10-24
Information query
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