Invention Grant
- Patent Title: Film forming method and patterning method
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Application No.: US15695147Application Date: 2017-09-05
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Publication No.: US10707073B2Publication Date: 2020-07-07
- Inventor: Yoshio Susa , Yuko Kengoyama , Taishi Ebisudani
- Applicant: ASM IP Holding B.V.
- Applicant Address: NL Almere
- Assignee: ASM IP Holding B.V.
- Current Assignee: ASM IP Holding B.V.
- Current Assignee Address: NL Almere
- Agency: Studebaker & Brackett PC
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/28 ; H01L21/033 ; H01L21/311 ; C23C16/455 ; C23C16/56 ; C23C16/40 ; C23C16/04

Abstract:
Examples of a film forming method includes repeating first processing and second processing in this order a plurality of times, wherein the first processing supplies material-1 having one silicon atom per molecule onto a substrate, and then generates plasma while reactant gas is introduced, thereby forming a silicon oxide film on the substrate, and the second processing provides material-2 having two or more silicon atoms per molecule onto the substrate, and then generates plasma while no reactant gas is introduced, thereby forming a double silicon compound on the substrate.
Public/Granted literature
- US20190074172A1 FILM FORMING METHOD AND PATTERNING METHOD Public/Granted day:2019-03-07
Information query
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