Invention Grant
- Patent Title: Plasma processing apparatus and plasma processing method
-
Application No.: US15831564Application Date: 2017-12-05
-
Publication No.: US10832891B2Publication Date: 2020-11-10
- Inventor: Ryota Sakane , Hideyuki Kobayashi , Hiroshi Nagahata , Jungwoo Na
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@60be2b31
- Main IPC: H01J37/32
- IPC: H01J37/32 ; H01L21/02 ; H01L21/311 ; H01L21/033 ; C23C16/458 ; C23C16/505 ; H01L21/3065 ; H01L21/67 ; H01L21/683

Abstract:
A plasma processing apparatus includes a process chamber, and a pedestal provided in the process chamber and configured to hold a substrate. The plasma processing apparatus includes a first gas supply part configured to be able to supply a first gas from a location facing the pedestal, and a radio frequency power source configured to convert the first gas to plasma. A shield part to block the first gas converted to plasma is provided around the pedestal. The plasma processing apparatus further includes an evacuation part configured to evacuate the process chamber through the shield part, and a second gas supply part configured to be able to supply a second gas to a space between the shield part and the evacuation part.
Public/Granted literature
- US20180158650A1 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD Public/Granted day:2018-06-07
Information query