Invention Grant
- Patent Title: Nonvolatile memory device configured to adjust a read parameter based on degradation level
-
Application No.: US16865675Application Date: 2020-05-04
-
Publication No.: US10910080B2Publication Date: 2021-02-02
- Inventor: Jin Bae Bang , Seung Hwan Song , Dae Seok Byeon , Il Han Park , Hyun Jun Yoon , Han Jun Lee , Na Young Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Hamess, Dickey and Pierce, P.L.C.
- Priority: KR10-2018-0029752 20180314
- Main IPC: G11C27/00
- IPC: G11C27/00 ; G11C11/56 ; G06F11/10 ; G11C16/28 ; G06F3/06 ; G11C16/26 ; G11C16/04

Abstract:
A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.
Public/Granted literature
- US20200265908A1 NONVOLATILE MEMORY DEVICE Public/Granted day:2020-08-20
Information query