Invention Grant
- Patent Title: Structure and method of forming a semiconductor device
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Application No.: US16560810Application Date: 2019-09-04
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Publication No.: US10971633B2Publication Date: 2021-04-06
- Inventor: Francesco La Rosa , Stephan Niel , Arnaud Regnier
- Applicant: STMicroelectronics (Rousset) SAS
- Applicant Address: FR Rousset
- Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee Address: FR Rousset
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/861
- IPC: H01L29/861 ; H01L27/07 ; H01L29/788 ; H01L29/66

Abstract:
In accordance with an embodiment of the present invention, a method of making a semiconductor device includes simultaneously etching a semiconductor layer and a conductive layer to form a self-aligned diode region disposed on an insulating layer, where the semiconductor layer has a first conductivity type. The method further includes etching through first openings of a mask layer to form first implantation surfaces on the semiconductor layer and to form a plurality of projecting regions including conductive material of the conductive layer over the semiconductor layer. The method further includes using the plurality of projecting regions as a part of a first implantation mask, performing a first implantation of dopants having a second conductivity type into the semiconductor layer, to form a sequence of PN junctions forming diodes in the semiconductor layer. The diodes vertically extend from an upper surface of the semiconductor layer to the insulating layer.
Public/Granted literature
- US20210066510A1 Structure and Method of Forming a Semiconductor Device Public/Granted day:2021-03-04
Information query
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