Invention Grant
- Patent Title: Package structure and method of fabricating the same
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Application No.: US16745338Application Date: 2020-01-17
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Publication No.: US11239134B2Publication Date: 2022-02-01
- Inventor: Chih-Hao Chen , Chin-Fu Kao , Li-Hui Cheng , Szu-Wei Lu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/367
- IPC: H01L23/367 ; H01L23/31 ; H01L23/00 ; H01L21/48 ; H01L21/683 ; H01L21/56

Abstract:
A structure includes a circuit substrate, a device, a metal layer, a lid and a thermal interface material layer. The device is disposed on and electrically connected to the circuit substrate. The device includes at least one semiconductor die laterally encapsulated by an insulating encapsulation. The metal layer is covering a back surface of the at least one semiconductor die and the insulating encapsulation. The lid is disposed on the circuit substrate, and the lid is adhered to the metal layer through the thermal interface material layer.
Public/Granted literature
- US20210225727A1 PACKAGE STRUCTURE AND METHOD OF FABRICATING THE SAME Public/Granted day:2021-07-22
Information query
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