- 专利标题: Bonding apparatus, bonding system, bonding method, and recording medium
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申请号: US16347868申请日: 2017-10-11
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公开(公告)号: US11488929B2公开(公告)日: 2022-11-01
- 发明人: Takashi Nakamitsu , Shuhei Matsumoto , Yosuke Omori
- 申请人: Tokyo Electron Limited
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Pearne & Gordon LLP
- 优先权: JPJP2016-218580 20161109
- 国际申请: PCT/JP2017/036782 WO 20171011
- 国际公布: WO2018/088094 WO 20180517
- 主分类号: H01L21/68
- IPC分类号: H01L21/68 ; H01L23/00 ; H01L21/67 ; H01L21/683 ; H01L21/20 ; B23K20/00 ; H01L21/02
摘要:
A bonding apparatus configured to bond substrates comprises a first holder configured to vacuum-exhaust a first substrate to attract and hold the first substrate on a bottom surface thereof; a second holder disposed under the first holder, and configured to vacuum-exhaust a second substrate to attract and hold the second substrate on a top surface thereof; a mover configured to move the first holder and the second holder relatively in a horizontal direction; a laser interferometer system configured to measure a position of the first holder or the second holder which is moved by the mover; a linear scale configured to measure a position of the mover; and a controller configured to control the mover based on a measurement result of the laser interferometer system and a measurement result of the liner scale.
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