Invention Grant
- Patent Title: Voltage droop monitoring circuits, system-on chips and methods of operating the system-on chips
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Application No.: US16519621Application Date: 2019-07-23
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Publication No.: US11531385B2Publication Date: 2022-12-20
- Inventor: Yong-Hwan Kim , Wook Kim , In-Sub Shin
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, PL.C
- Priority: KR10-2018-0110784 20180917,KR10-2019-0014363 20190207
- Main IPC: G06F1/28
- IPC: G06F1/28 ; G06F1/32 ; H03K3/03 ; H03K3/037 ; H03L7/08 ; H03L7/097 ; H03L7/099 ; G06F1/3296 ; G06F1/08 ; G01R9/00 ; G06F15/78

Abstract:
In one embodiment, the voltage droop monitoring circuit includes a ring oscillator circuit block configured to generate a plurality of oscillation signals and configured to output a selected oscillation signal from one of the plurality of oscillation signals based on a first control signal. The first control signal is based on a power supply voltage of a functional circuit block. The voltage droop monitoring circuit further includes a counter configured to generate a count value based on the selected oscillation signal, and a droop detector configured detect droop in the power supply voltage of the functional circuit block based on the count value and at least one threshold value.
Public/Granted literature
- US20200089299A1 VOLTAGE DROOP MONITORING CIRCUITS, SYSTEM-ON CHIPS AND METHODS OF OPERATING THE SYSTEM-ON CHIPS Public/Granted day:2020-03-19
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