- Patent Title: Integrated assemblies and methods of forming integrated assemblies
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Application No.: US16988156Application Date: 2020-08-07
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Publication No.: US11600630B2Publication Date: 2023-03-07
- Inventor: Jordan D. Greenlee , Nancy M. Lomeli , John D. Hopkins , Jiewei Chen , Indra V. Chary , Jun Fang , Vladimir Samara , Kaiming Luo , Rita J. Klein , Xiao Li , Vinayak Shamanna
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L27/11568
- IPC: H01L27/11568 ; H01L27/11556 ; H01L27/11582 ; G11C5/06 ; H01L21/306 ; G11C16/04 ; G11C5/02

Abstract:
Some embodiments include an integrated assembly having a source structure, and having a stack of alternating conductive levels and insulative levels over the source structure. Cell-material-pillars pass through the stack. The cell-material-pillars are arranged within a configuration which includes a first memory-block-region and a second memory-block-region. The cell-material-pillars include channel material which is electrically coupled with the source structure. Memory cells are along the conductive levels and include regions of the cell-material-pillars. A panel is between the first and second memory-block-regions. The panel has a first material configured as a container shape. The container shape defines opposing sides and a bottom of a cavity. The panel has a second material within the cavity. The second material is compositionally different from the first material. Some embodiments include methods of forming integrated assemblies.
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