Invention Grant
- Patent Title: Substrate liquid processing apparatus, substrate liquid processing method and recording medium
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Application No.: US16767278Application Date: 2018-11-22
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Publication No.: US11795546B2Publication Date: 2023-10-24
- Inventor: Takashi Tanaka , Keiichi Fujita , Yuichiro Inatomi
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP 17228073 2017.11.28
- International Application: PCT/JP2018/043097 2018.11.22
- International Announcement: WO2019/107258A 2019.06.06
- Date entered country: 2020-05-27
- Main IPC: C23C18/18
- IPC: C23C18/18 ; C23C18/16 ; C23G1/02 ; C23G3/00 ; H01L21/02

Abstract:
A substrate processing apparatus includes a substrate holder configured to horizontally hold and rotate a substrate which has a recess and a base metal layer exposed from a bottom surface of the recess; and a pre-cleaning liquid supply configured to supply a pre-cleaning liquid such as dicarboxylic acid or tricarboxylic acid onto the substrate being held and rotated by the substrate holder, to thereby pre-clean the base metal layer. A temperature of the pre-cleaning liquid on the substrate is equal to or higher than 40° C.
Public/Granted literature
- US20210002770A1 SUBSTRATE LIQUID PROCESSING APPARATUS, SUBSTRATE LIQUID PROCESSING METHOD AND RECORDING MEDIUM Public/Granted day:2021-01-07
Information query
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