- 专利标题: Cross-point MRAM including self-compliance selector
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申请号: US17227294申请日: 2021-04-10
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公开(公告)号: US11848039B2公开(公告)日: 2023-12-19
- 发明人: Zhiqiang Wei , Kimihiro Satoh , Woojin Kim , Zihui Wang
- 申请人: Avalanche Technology, Inc.
- 申请人地址: US CA Fremont
- 专利权人: Avalanche Technology, Inc.
- 当前专利权人: Avalanche Technology, Inc.
- 当前专利权人地址: US CA Fremont
- 代理商 Bing K. Yen
- 分案原申请号: US15863825 2018.01.05
- 主分类号: G11C11/16
- IPC分类号: G11C11/16 ; H10B61/00 ; H10N50/10 ; H10N50/80 ; H10N50/85
摘要:
The present invention is directed to a magnetic memory cell including a magnetic tunnel junction (MTJ) memory element and a two-terminal bidirectional selector coupled in series between two conductive lines. The MTJ memory element includes a magnetic free layer; a magnetic reference layer; and an insulating tunnel junction layer interposed therebetween. The two-terminal bidirectional selector includes a bottom electrode; a top electrode; a load-resistance layer interposed between the bottom and top electrodes and comprising a first tantalum oxide; a first volatile switching layer interposed between the bottom and top electrodes and comprising a metal dopant and a second tantalum oxide that has a higher oxygen content than the first tantalum oxide; and a second volatile switching layer in contact with the first volatile switching layer and comprising a third tantalum oxide that has a higher oxygen content than the first tantalum oxide.
公开/授权文献
- US20220383920A9 Cross-Point MRAM Including Self-Compliance Selector 公开/授权日:2022-12-01
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