Invention Grant
- Patent Title: Bonding to alignment marks with dummy alignment marks
-
Application No.: US17325667Application Date: 2021-05-20
-
Publication No.: US11862599B2Publication Date: 2024-01-02
- Inventor: Hsien-Wei Chen , Ying-Ju Chen , Ming-Fa Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L23/544
- IPC: H01L23/544 ; H01L25/065 ; H01L23/00 ; H01L23/48 ; H01L21/304 ; H01L21/683 ; H01L21/768 ; H01L25/00

Abstract:
A method includes placing a first package component. The first package component includes a first alignment mark and a first dummy alignment mark. A second package component is aligned to the first package component. The second package component includes a second alignment mark and a second dummy alignment mark. The aligning is performed using the first alignment mark for positioning the first package component, and using the second alignment mark for position the second package component. The second package component is bonded to the first package component to form a package, with the first alignment mark being bonded to the second dummy alignment mark.
Public/Granted literature
- US20220310554A1 Bonding to Alignment marks with Dummy Alignment Marks Public/Granted day:2022-09-29
Information query
IPC分类: