Invention Grant
- Patent Title: Contact probe, probe holder and probe unit
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Application No.: US17911827Application Date: 2021-03-17
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Publication No.: US12188977B2Publication Date: 2025-01-07
- Inventor: Tsuyoshi Inuma , Shuji Takahashi , Kazuya Soma , Takashi Nidaira , Yuya Hironaka
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Locke Lord LLP
- Priority: JP2020-053388 20200324
- International Application: PCT/JP2021/010922 WO 20210317
- International Announcement: WO2021/193304 WO 20210930
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R1/04 ; G01R1/067 ; G01R31/28

Abstract:
A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
Public/Granted literature
- US20230138105A1 PROBE UNIT Public/Granted day:2023-05-04
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