公开(公告)号：US10120011B2

公开(公告)日：2018-11-06

申请号：US15117884

申请日：2015-02-12

Applicant: NHK Spring Co., Ltd.

Inventor： Kohei Hironaka ,  Takashi Nidaira ,  Tomohiro Yoneda

IPC: G01R31/02 ,  G01R1/073 ,  H01R13/24 ,  G01R31/28 ,  G01R31/26

Abstract: A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.

公开(公告)号：US12188977B2

公开(公告)日：2025-01-07

申请号：US17911827

申请日：2021-03-17

Applicant: NHK Spring Co., Ltd.

Inventor： Tsuyoshi Inuma ,  Shuji Takahashi ,  Kazuya Soma ,  Takashi Nidaira ,  Yuya Hironaka

IPC: G01R1/073 ,  G01R1/04 ,  G01R1/067 ,  G01R31/28

Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

公开(公告)号：US20250035699A1

公开(公告)日：2025-01-30

申请号：US18911750

申请日：2024-10-10

Applicant: NHK Spring Co., Ltd.

Inventor： Tsuyoshi Inuma ,  Shuji Takahashi ,  Kazuya Soma ,  Takashi Nidaira ,  Yuya Hironaka

IPC: G01R31/28 ,  G01R1/073

Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

公开(公告)号：US20230138105A1

公开(公告)日：2023-05-04

申请号：US17911827

申请日：2021-03-17

Applicant: NHK Spring Co., Ltd.

Inventor： Tsuyoshi Inuma ,  Shuji Takahashi ,  Kazuya Soma ,  Takashi Nidaira ,  Yuya Hironaka

IPC: G01R31/28 ,  G01R1/073

Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.