Contact probe, probe holder and probe unit

    公开(公告)号:US12241913B2

    公开(公告)日:2025-03-04

    申请号:US18161161

    申请日:2023-01-30

    Abstract: A contact probe includes: a first plunger; a second plunger; and a coil spring provided between the first and second plungers and configured to connect the first and second plungers to each other so as to freely advance and retreat. The first plunger is provided with a groove portion formed on a side surface of the first plunger.

    CONTACT PROBE AND SIGNAL TRANSMISSION METHOD

    公开(公告)号:US20220146552A1

    公开(公告)日:2022-05-12

    申请号:US17437152

    申请日:2020-03-12

    Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

    CONTACT PROBE AND PROBE UNIT
    3.
    发明申请

    公开(公告)号:US20210156887A1

    公开(公告)日:2021-05-27

    申请号:US16633597

    申请日:2018-07-26

    Abstract: A contact probe includes: a cylindrical pipe member; a collar including a hollow portion and fixed to an inner circumferential side of at least one end in a longitudinal direction of the pipe member; and an inner conductor including a flange configured to abut on a stepped portion formed by the pipe member and the collar, the inner conductor being expandable and contractible along the longitudinal direction and penetrating the pipe member.

    Contact probe, probe holder and probe unit

    公开(公告)号:US12188977B2

    公开(公告)日:2025-01-07

    申请号:US17911827

    申请日:2021-03-17

    Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

    PROBE UNIT
    5.
    发明公开
    PROBE UNIT 审中-公开

    公开(公告)号:US20240053380A1

    公开(公告)日:2024-02-15

    申请号:US18271485

    申请日:2021-09-10

    CPC classification number: G01R1/06722

    Abstract: A probe unit includes: a contact probe that comes into contact with, at both ends of a longitudinal length of the contact probe, each of electrodes that are contact targets; and a probe holder including a main body portion configured to hold the contact probe, the main body portion being insulating. The main body portion includes, formed therein: a holder hole configured to hold the contact probe inserted in the holder hole; and a counterbore portion drilled in at least part of an area around the holder hole, the area being on one of surfaces of the main body portion, the surfaces being near one end and another end of the contact probe, the counterbore portion having an inner wall surface that forms a hollow space and that is insulating.

    Contact probe and probe unit
    6.
    发明授权

    公开(公告)号:US11656246B2

    公开(公告)日:2023-05-23

    申请号:US17848603

    申请日:2022-06-24

    CPC classification number: G01R1/073 G01R1/0466 G01R1/06722

    Abstract: A probe unit includes: a signal probe configured to receive and output a signal from and to a predetermined circuit structure; a power supply probe configured to supply power to the predetermined circuit structure; a grounding probe configured to supply a ground potential to the predetermined circuit structure; and a conductive probe holder including a plurality of hole portions in which the signal probe, the power supply probe, and the grounding probe are insertable, the plurality of hole portions having a same hole shape as one another, wherein the signal probe, the power supply probe, and the grounding probe inserted into the plurality of hole portions are interchangeable with one another to change an arrangement of the signal probe, the power supply probe, and the grounding probe.

    CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

    公开(公告)号:US20250035699A1

    公开(公告)日:2025-01-30

    申请号:US18911750

    申请日:2024-10-10

    Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.

    PROBE CARD
    8.
    发明公开
    PROBE CARD 审中-公开

    公开(公告)号:US20240353445A1

    公开(公告)日:2024-10-24

    申请号:US18761394

    申请日:2024-07-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    Probe card
    9.
    发明授权

    公开(公告)号:US12092660B2

    公开(公告)日:2024-09-17

    申请号:US17909593

    申请日:2021-03-02

    CPC classification number: G01R1/07342 G01R1/07314 H01L22/00

    Abstract: A probe card includes: a plurality of conductive contact probes; a probe head configured to accommodate ends of the plurality of contact probes; a laminated member laminated on the probe head on a side opposite to a side of the probe head; and a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including a head provided on the side of the probe head in which the contact probes extend outwardly, and a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head. The shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other.

    CONTACT PROBE AND PROBE UNIT
    10.
    发明公开

    公开(公告)号:US20240264200A1

    公开(公告)日:2024-08-08

    申请号:US18424927

    申请日:2024-01-29

    CPC classification number: G01R1/06722 G01R1/06738 G01R1/07314

    Abstract: A contact probe includes: a first plunger including a tip end configured to be contact with one of electrode, and a flange that is continuous to the tip end; and a coil spring configured to be joined to the first plunger. The tip end includes: a tip contact including a tip configured to be contact with the one of the electrode; a columnar first base portion provided to a base end side of the tip contact, and including a lateral side surface extending along a longitudinal axis of the first plunger; and a second base portion provided to an end of the first base portion, the end being on a side opposite to the tip contact, the second base portion including an inclined lateral side inclined in a manner approaching the longitudinal axis of the first plunger, as the inclined lateral side extends toward the flange.

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