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公开(公告)号:US12188977B2
公开(公告)日:2025-01-07
申请号:US17911827
申请日:2021-03-17
Applicant: NHK Spring Co., Ltd.
Inventor: Tsuyoshi Inuma , Shuji Takahashi , Kazuya Soma , Takashi Nidaira , Yuya Hironaka
Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
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公开(公告)号:US20250035699A1
公开(公告)日:2025-01-30
申请号:US18911750
申请日:2024-10-10
Applicant: NHK Spring Co., Ltd.
Inventor: Tsuyoshi Inuma , Shuji Takahashi , Kazuya Soma , Takashi Nidaira , Yuya Hironaka
Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
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公开(公告)号:US20230138105A1
公开(公告)日:2023-05-04
申请号:US17911827
申请日:2021-03-17
Applicant: NHK Spring Co., Ltd.
Inventor: Tsuyoshi Inuma , Shuji Takahashi , Kazuya Soma , Takashi Nidaira , Yuya Hironaka
Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
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