发明申请
- 专利标题: Method for fabricating microchips using metal oxide masks
- 专利标题(中): 使用金属氧化物掩模制造微芯片的方法
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申请号: US11040091申请日: 2005-01-24
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公开(公告)号: US20050181557A1公开(公告)日: 2005-08-18
- 发明人: Stefan Jakschik , Thomas Hecht , Uwe Schroder , Matthias Goldbach
- 申请人: Stefan Jakschik , Thomas Hecht , Uwe Schroder , Matthias Goldbach
- 优先权: DE10234734.4 20020730
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; H01L21/311 ; H01L21/314 ; H01L21/316 ; H01L21/334 ; H01L21/8242
摘要:
A process for modifying sections of a semiconductor includes covering the sections to remain free of doping with a metal oxide, e.g., aluminum oxide. Then, the semiconductor is doped, for example, from the gas phase, in those sections that are not covered by the aluminum oxide. Finally, the aluminum oxide is selectively removed again, for example using hot phosphoric acid. Sections of the semiconductor surface which are formed from silicon, silicon oxide or silicon nitride remain in place on the wafer.
公开/授权文献
- US07268037B2 Method for fabricating microchips using metal oxide masks 公开/授权日:2007-09-11
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