发明申请
US20050270889A1 Dynamic random access memory (DRAM) capable of canceling out complimentary noise development in plate electrodes of memory cell capacitors
有权
动态随机存取存储器(DRAM)能够消除存储单元电容器的平板电极中的互补噪声发展
- 专利标题: Dynamic random access memory (DRAM) capable of canceling out complimentary noise development in plate electrodes of memory cell capacitors
- 专利标题(中): 动态随机存取存储器(DRAM)能够消除存储单元电容器的平板电极中的互补噪声发展
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申请号: US11198357申请日: 2005-08-08
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公开(公告)号: US20050270889A1公开(公告)日: 2005-12-08
- 发明人: Tomonori Sekiguchi , Kazuhiko Kajigaya , Katsutaka Kimura , Riichiro Takemura , Tsugio Takahashi , Yoshitaka Nakamura
- 申请人: Tomonori Sekiguchi , Kazuhiko Kajigaya , Katsutaka Kimura , Riichiro Takemura , Tsugio Takahashi , Yoshitaka Nakamura
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 优先权: JP11-294615 19991015
- 主分类号: G11C11/401
- IPC分类号: G11C11/401 ; G11C5/02 ; G11C5/06 ; G11C7/02 ; G11C7/18 ; G11C8/00 ; G11C11/34 ; G11C11/4097 ; H01L21/8242 ; H01L27/02 ; H01L27/108
摘要:
Disclosed herein is a dynamic RAM comprising a plurality of word lines respectively connected to address select terminals of a plurality of dynamic memory cells, a plurality of complementary bit line pairs respectively connected to input/output terminals of the plurality of dynamic memory cells and placed in directions opposite to one another, and a sense amplifier array which is supplied with an operating voltage according to an operation timing signal and comprises a plurality of latch circuits for respectively amplifying the differences in voltage between the complementary bit line pairs. In the dynamic RAM, common electrodes provided in opposing relationship to storage nodes corresponding to connecting points between address select MOSFETs and information storage capacitors of the plurality of dynamic memory cells provided on both sides with the sense amplifier array as the center are connected to one another while circuit connections in the sense amplifier array are being ensured by wiring means using the common electrodes.,
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