发明申请
- 专利标题: METHODS OF THIN FILM PROCESS
- 专利标题(中): 薄膜工艺方法
-
申请号: US11947674申请日: 2007-11-29
-
公开(公告)号: US20080182382A1公开(公告)日: 2008-07-31
- 发明人: Nitin K. Ingle , Jing Tang , Yi Zheng , Zheng Yuan , Zhenbin Ge , Xinliang Lu , Chien-Teh Kao , Vikash Banthia , William H. McClintock , Mei Chang
- 申请人: Nitin K. Ingle , Jing Tang , Yi Zheng , Zheng Yuan , Zhenbin Ge , Xinliang Lu , Chien-Teh Kao , Vikash Banthia , William H. McClintock , Mei Chang
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
A method for forming a semiconductor structure includes forming a plurality of features across a surface of a substrate, with at least one space being between two adjacent features. A first dielectric layer is formed on the features and within the at least one space. A portion of the first dielectric layer interacts with a reactant derived from a first precursor and a second precursor to form a first solid product. The first solid product is decomposed to substantially remove the portion of the first dielectric layer. A second dielectric layer is formed to substantially fill the at least one space.
公开/授权文献
- US07939422B2 Methods of thin film process 公开/授权日:2011-05-10
信息查询
IPC分类: