Invention Application
- Patent Title: SUBSTRATE PROCESSING METHOD AND RECORDING MEDIUM
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Application No.: US15443687Application Date: 2017-02-27
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Publication No.: US20170250086A1Publication Date: 2017-08-31
- Inventor: Tomonari URANO , Kyohei NOGUCHI , Osamu YOKOYAMA , Takashi KOBAYASHI , Satoshi WAKABAYASHI , Takashi SAKUMA
- Applicant: TOKYO ELECTRON LIMITED
- Priority: JP2016-036013 20160226
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01L21/673 ; H01L21/67

Abstract:
A substrate processing method is for forming a metal film on a target substrate by using a plasma. The method includes loading a target substrate having a silicon-containing layer on a surface thereof into a processing chamber which is pre-coated by a film containing a metal, introducing hydrogen gas and a gaseous compound of the metal and halogen into the processing chamber, generating a plasma, and forming a metal film on the target substrate. The method further includes performing a first reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, unloading the target substrate from the processing chamber, performing a second reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, and loading a next target substrate into the processing chamber.
Public/Granted literature
- US10242878B2 Substrate processing method and recording medium Public/Granted day:2019-03-26
Information query
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